Inventor
TOMITA EISUKE
JP12 patents
⚠️ This page may combine multiple inventors who share the name “TOMITA EISUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SEIKO INSTR INC
11 patentsUS5894122AApr 13, 1999
Scanning near field optical microscope
SEIKO INSTR INC106 citations97
US6249000B1Jun 19, 2001
Scanning probe microscope
SEIKO INSTR INC56 citations96
US6257053B1Jul 10, 2001
Scanning probe microscope having piezoelectric member for controlling movement of probe
SEIKO INSTR INC41 citations92
US6201227B1Mar 13, 2001
Scanning probe microscope
SEIKO INSTR INC44 citations92
US6194711B1Feb 27, 2001
Scanning near-field optical microscope
SEIKO INSTR INC54 citations92
US5990477ANov 23, 1999
Apparatus for machining, recording, and reproducing, using scanning probe microscope
SEIKO INSTR INC21 citations92
US5623205AApr 22, 1997
Method and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic field
SEIKO INSTR INC27 citations92
US5120959AJun 9, 1992
Apparatus for simultaneously effecting electrochemical measurement and measurement of tunneling current and tunnel probe therefor
SEIKO INSTR INC30 citations92
US4969978ANov 13, 1990
Apparatus and method for tunnel current measurement observed simultaneously with electrochemical measurement
SEIKO INSTR INC33 citations91
US6081113AJun 27, 2000
Cantilever magnetic force sensor for magnetic force microscopy having a magnetic probe coated with a hard-magnetic material
SEIKO INSTR INC9 citations72
US6373246B1Apr 16, 2002
Cantilever magnetic force sensor for magnetic force microscopy and method of manufacturing magnetic force sensor
SEIKO INSTR INC3 citations61