Inventor
TAKEMOTO MEGUMI
JP14 patents
⚠️ This page may combine multiple inventors who share the name “TAKEMOTO MEGUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
10 patentsUS6633176B2Oct 14, 2003
Semiconductor device test probe having improved tip portion and manufacturing method thereof
MITSUBISHI ELECTRIC CORP47 citations95
US7274195B2Sep 25, 2007
Semiconductor device test probe
MITSUBISHI ELECTRIC CORP26 citations92
US6741086B2May 25, 2004
Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus
MITSUBISHI ELECTRIC CORP50 citations92
US6888344B2May 3, 2005
Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter
MITSUBISHI ELECTRIC CORP24 citations91
US7276923B2Oct 2, 2007
Semiconductor device test probe
MITSUBISHI ELECTRIC CORP12 citations83
US6885204B2Apr 26, 2005
Probe card, and testing apparatus having the same
MITSUBISHI ELECTRIC CORP7 citations73
US6667626B2Dec 23, 2003
Probe card, and testing apparatus having the same
MITSUBISHI ELECTRIC CORP6 citations73
US6628127B2Sep 30, 2003
Probe card for testing semiconductor integrated circuit and method of manufacturing the same
MITSUBISHI ELECTRIC CORP9 citations73
US7825677B2Nov 2, 2010
Test jig for testing a packaged high frequency semiconductor device
MITSUBISHI ELECTRIC CORP4 citations62
US5972069AOct 26, 1999
Metallic material made from tungsten or molybdenum, method of producing the metallic material, and secondary product material using the metallic material
MITSUBISHI ELECTRIC CORP3 citations62