Inventor
MAEKAWA SHIGEKI
JP20 patents
⚠️ This page may combine multiple inventors who share the name “MAEKAWA SHIGEKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
17 patentsUS6633176B2Oct 14, 2003
Semiconductor device test probe having improved tip portion and manufacturing method thereof
MITSUBISHI ELECTRIC CORP47 citations95
US6794890B1Sep 21, 2004
Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested
MITSUBISHI ELECTRIC CORP48 citations94
US6344753B1Feb 5, 2002
Test socket having improved contact terminals, and method of forming contact terminals of the test socket
MITSUBISHI ELECTRIC CORP64 citations94
US7274195B2Sep 25, 2007
Semiconductor device test probe
MITSUBISHI ELECTRIC CORP26 citations92
US6741086B2May 25, 2004
Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus
MITSUBISHI ELECTRIC CORP50 citations92
US5433262AJul 18, 1995
Method for manufacturing casting and apparatus for manufacturing a casting
MITSUBISHI ELECTRIC CORP30 citations92
US6888344B2May 3, 2005
Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter
MITSUBISHI ELECTRIC CORP24 citations91
US6989681B2Jan 24, 2006
Socket for testing a semiconductor device and a connecting sheet used for the same
MITSUBISHI ELECTRIC CORP15 citations84
US6882069B1Apr 19, 2005
Vehicle AC generator with rectifier diode package disposed between cooling plates
MITSUBISHI ELECTRIC CORP16 citations84
US7276923B2Oct 2, 2007
Semiconductor device test probe
MITSUBISHI ELECTRIC CORP12 citations83
US5067550ANov 26, 1991
Manufacturing method for defect-free casting product
MITSUBISHI ELECTRIC CORP13 citations74
US6885204B2Apr 26, 2005
Probe card, and testing apparatus having the same
MITSUBISHI ELECTRIC CORP7 citations73
US6667626B2Dec 23, 2003
Probe card, and testing apparatus having the same
MITSUBISHI ELECTRIC CORP6 citations73
US6628127B2Sep 30, 2003
Probe card for testing semiconductor integrated circuit and method of manufacturing the same
MITSUBISHI ELECTRIC CORP9 citations73
US7534979B2May 19, 2009
Pressure-contact type rectifier with contact friction reducer
MITSUBISHI ELECTRIC CORP7 citations71
US5972069AOct 26, 1999
Metallic material made from tungsten or molybdenum, method of producing the metallic material, and secondary product material using the metallic material
MITSUBISHI ELECTRIC CORP3 citations62
US7785406B2Aug 31, 2010
Apparatus for volatile organic compound treatment and method of volatile organic compound treatment
MITSUBISHI ELECTRIC CORP1 citations51