Inventor
CHAN JOHNNY
US38 patents
⚠️ This page may combine multiple inventors who share the name “CHAN JOHNNY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ATMEL CORP
23 patentsUS6097657AAug 1, 2000
Method for reading out the contents of a serial memory
ATMEL CORP16 citations92
US6038185AMar 14, 2000
Method and apparatus for a serial access memory
ATMEL CORP35 citations92
US7848151B2Dec 7, 2010
Circuit to control voltage ramp rate
ATMEL CORP15 citations91
US7512008B2Mar 31, 2009
Circuit to control voltage ramp rate
ATMEL CORP16 citations91
US7710105B2May 4, 2010
Circuit reset testing methods
ATMEL CORP8 citations84
US7427890B2Sep 23, 2008
Charge pump regulator with multiple control options
ATMEL CORP13 citations84
US7369446B2May 6, 2008
Method and apparatus to prevent high voltage supply degradation for high-voltage latches of a non-volatile memory
ATMEL CORP9 citations84
US7180795B1Feb 20, 2007
Method of sensing an EEPROM reference cell
ATMEL CORP12 citations84
US7279961B2Oct 9, 2007
Charge pump for intermediate voltage
ATMEL CORP18 citations82
US7145318B1Dec 5, 2006
Negative voltage regulator
ATMEL CORP14 citations82
US7751256B2Jul 6, 2010
Method and apparatus to prevent high voltage supply degradation for high-voltage latches of a non-volatile memory
ATMEL CORP6 citations73
US7519486B2Apr 14, 2009
Method and apparatus to test the power-on-reset trip point of an integrated circuit
ATMEL CORP7 citations73
US6998884B2Feb 14, 2006
Circuit for auto-clamping input pins to a definite voltage during power-up or reset
ATMEL CORP8 citations71
US7307898B2Dec 11, 2007
Method and apparatus for implementing walkout of device junctions
ATMEL CORP6 citations62
US7863959B2Jan 4, 2011
Apparatus and methods for a high-voltage latch
ATMEL CORP5 citations61
US7453725B2Nov 18, 2008
Apparatus for eliminating leakage current of a low Vt device in a column latch
ATMEL CORP4 citations61
US7295046B2Nov 13, 2007
Power down detection circuit
ATMEL CORP5 citations61
US7257668B2Aug 14, 2007
Method and system for enhancing the endurance of memory cells
ATMEL CORP3 citations60
US7082490B2Jul 25, 2006
Method and system for enhancing the endurance of memory cells
ATMEL CORP3 citations60
US6891917B2May 10, 2005
Shift register with reduced area and power consumption
ATMEL CORP6 citations60
US7233528B2Jun 19, 2007
Reduction of programming time in electrically programmable devices
ATMEL CORP1 citations50
US6856557B2Feb 15, 2005
Signal integrity checking circuit
ATMEL CORP1 citations49
US7304514B2Dec 4, 2007
Methods and circuits for sensing on-chip voltage in powerup mode
ATMEL CORP0 citations42
WINBOND ELECTRONICS CORP
10 patentsUS9576652B1Feb 21, 2017
Resistive random access memory apparatus with forward and reverse reading modes
WINBOND ELECTRONICS CORP11 citations84
US8804436B1Aug 12, 2014
Method of partial refresh during erase operation
WINBOND ELECTRONICS CORP12 citations83
US10276259B2Apr 30, 2019
Memory testing method and memory apparatus therefor
WINBOND ELECTRONICS CORP2 citations73
US9627091B1Apr 18, 2017
Memory device and stress testing method of same
WINBOND ELECTRONICS CORP6 citations72
US9214211B2Dec 15, 2015
Methods of and apparatus for determining unique die identifiers for multiple memory die within a common package
WINBOND ELECTRONICS CORP2 citations63
US11600346B2Mar 7, 2023
Non-volatile memory and write cycle recording device thereof
WINBOND ELECTRONICS CORP0 citations52
US9013930B2Apr 21, 2015
Memory device with interleaved high-speed reading function and method thereof
WINBOND ELECTRONICS CORP1 citations51
US10579290B2Mar 3, 2020
Option code providing circuit and providing method thereof
WINBOND ELECTRONICS CORP0 citations42
US10152276B2Dec 11, 2018
Memory device including data processor and program method of same
WINBOND ELECTRONICS CORP0 citations42
US9377501B2Jun 28, 2016
Semiconductor wafers, and testing methods thereof
WINBOND ELECTRONICS CORP0 citations40