Inventor
ONO HARUYOSHI
JP16 patents
⚠️ This page may combine multiple inventors who share the name “ONO HARUYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
EUDYNA DEVICES INC
7 patentsUS7921343B2Apr 5, 2011
Testing system, testing system control method, and test apparatus
EUDYNA DEVICES INC2 citations61
US7316510B2Jan 8, 2008
Optical axis adjusting method, optical module producing method, optical axis adjusting apparatus, and optical module
EUDYNA DEVICES INC2 citations56
US7907650B2Mar 15, 2011
Laser module, control method of the same, control data of the same, and control data generation method
EUDYNA DEVICES INC0 citations51
US7757136B2Jul 13, 2010
Testing system, testing system control method, and test apparatus
EUDYNA DEVICES INC0 citations50
US7411178B2Aug 12, 2008
Wavelength measuring device for a single light receiving element and wavelength measuring method at different temperatures
EUDYNA DEVICES INC0 citations50
US7614801B2Nov 10, 2009
Optical axis adjusting method, optical module producing method, optical axis adjusting apparatus, and optical module
EUDYNA DEVICES INC1 citations45
US7644326B2Jan 5, 2010
Testing system and testing system control method
EUDYNA DEVICES INC0 citations40
ONO HARUYOSHI
4 patentsUS8506102B2Aug 13, 2013
Indicator and display apparatus
ONO HARUYOSHI2 citations60
US8120506B2Feb 21, 2012
Display unit having a dial and a central display
ONO HARUYOSHI4 citations59
US8248587B2Aug 21, 2012
Testing method of semiconductor laser and laser testing device
ONO HARUYOSHI0 citations50
US8783207B2Jul 22, 2014
Meter pointer device
ONO HARUYOSHI0 citations49
FUJITSU QUANTUM DEVICES LTD
3 patentsUS6822984B2Nov 23, 2004
Device for and method of testing semiconductor laser module
FUJITSU QUANTUM DEVICES LTD3 citations61
US6807199B2Oct 19, 2004
Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereof
FUJITSU QUANTUM DEVICES LTD3 citations61
US6748746B2Jun 15, 2004
Device and method for controlling temperature of semiconductor module
FUJITSU QUANTUM DEVICES LTD6 citations61