P

Inventor

KASTRUP BERNARDO

NL11 patents
⚠️ This page may combine multiple inventors who share the name “KASTRUP BERNARDO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASML NETHERLANDS BV

9 patents
US9507907B2Nov 29, 2016

Computational wafer inspection

ASML NETHERLANDS BV18 citations91
US10579772B2Mar 3, 2020

Computational wafer inspection

ASML NETHERLANDS BV7 citations82
US9990462B2Jun 5, 2018

Computational wafer inspection

ASML NETHERLANDS BV8 citations82
US11080459B2Aug 3, 2021

Computational wafer inspection

ASML NETHERLANDS BV2 citations71
US12500063B2Dec 16, 2025

Method and apparatus for inspection

ASML NETHERLANDS BV0 citations61
US12067340B2Aug 20, 2024

Computational wafer inspection

ASML NETHERLANDS BV0 citations61
US11875966B2Jan 16, 2024

Method and apparatus for inspection

ASML NETHERLANDS BV0 citations61
US11094502B2Aug 17, 2021

Method and apparatus for inspection

ASML NETHERLANDS BV0 citations61
US10915689B2Feb 9, 2021

Method and apparatus to correct for patterning process error

ASML NETHERLANDS BV0 citations49

TROOST KARS ZEGER

1 patent
US8259285B2Sep 4, 2012

Lithographic system, device manufacturing method, setpoint data optimization method, and apparatus for producing optimized setpoint data

TROOST KARS ZEGER5 citations57

FINDERS JOZEF MARIA

1 patent
US9229336B2Jan 5, 2016

Lithographic apparatus and methods for determining an improved configuration of a lithographic apparatus

FINDERS JOZEF MARIA0 citations37