Inventor
CHAN TZE HO SIMON
SG20 patents
⚠️ This page may combine multiple inventors who share the name “CHAN TZE HO SIMON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBALFOUNDRIES SG PTE LTD
11 patentsUS9583167B2Feb 28, 2017
Low power memory cell with high sensing margin
GLOBALFOUNDRIES SG PTE LTD54 citations96
US9589616B2Mar 7, 2017
Energy efficient three-terminal voltage controlled memory cell
GLOBALFOUNDRIES SG PTE LTD23 citations93
US9349772B2May 24, 2016
Methods for fabricatingintegrated circuits with spin torque transfer magnetic randomaccess memory (STT-MRAM) including a passivation layer formed along lateral sidewalls of a magnetic tunnel junction of the STT-MRAM
GLOBALFOUNDRIES SG PTE LTD8 citations83
US9165610B1Oct 20, 2015
Non-volatile memory cell arrays and methods of fabricating semiconductor devices
GLOBALFOUNDRIES SG PTE LTD8 citations83
US9076962B2Jul 7, 2015
Nonvolative memory
GLOBALFOUNDRIES SG PTE LTD12 citations83
US9082964B2Jul 14, 2015
Nonvolative memory with filament
GLOBALFOUNDRIES SG PTE LTD5 citations72
US11119917B2Sep 14, 2021
Neuromorphic memories with split gate flash multi-level cell and method of making the same
GLOBALFOUNDRIES SG PTE LTD0 citations62
US9218875B2Dec 22, 2015
Resistive non-volatile memory
GLOBALFOUNDRIES SG PTE LTD2 citations61
US11942415B2Mar 26, 2024
Thin film based passive devices and methods of forming the same
GLOBALFOUNDRIES SG PTE LTD0 citations50
US9196356B2Nov 24, 2015
Stackable non-volatile memory
GLOBALFOUNDRIES SG PTE LTD0 citations40
US10236057B2Mar 19, 2019
Memory cells and methods for writing data to memory cells
GLOBALFOUNDRIES SG PTE LTD0 citations36
CHARTERED SEMICONDUCTOR MFG
8 patentsUS7902548B2Mar 8, 2011
Planar voltage contrast test structure
CHARTERED SEMICONDUCTOR MFG84 citations96
US6518122B1Feb 11, 2003
Low voltage programmable and erasable flash EEPROM
CHARTERED SEMICONDUCTOR MFG43 citations96
US7081378B2Jul 25, 2006
Horizontal TRAM and method for the fabrication thereof
CHARTERED SEMICONDUCTOR MFG45 citations95
US7183590B2Feb 27, 2007
Horizontal tram
CHARTERED SEMICONDUCTOR MFG5 citations73
US6828194B2Dec 7, 2004
Low voltage programmable and erasable flash EEPROM
CHARTERED SEMICONDUCTOR MFG7 citations73
US6760258B2Jul 6, 2004
Means to erase a low voltage programmable and erasable flash EEPROM
CHARTERED SEMICONDUCTOR MFG3 citations62
US7160741B2Jan 9, 2007
Planar voltage contrast test structure and method
CHARTERED SEMICONDUCTOR MFG4 citations61
US7101746B2Sep 5, 2006
Method to lower work function of gate electrode through Ge implantation
CHARTERED SEMICONDUCTOR MFG3 citations61