Inventor
KAO KO-BIN
TW21 patents
⚠️ This page may combine multiple inventors who share the name “KAO KO-BIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
16 patentsUS10388644B2Aug 20, 2019
Method of manufacturing conductors and semiconductor device which includes conductors
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US11688730B2Jun 27, 2023
Method and system of manufacturing conductors and semiconductor device which includes conductors
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10978439B2Apr 13, 2021
Method and system of manufacturing conductors and semiconductor device which includes conductors
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10388523B2Aug 20, 2019
Lithographic technique for feature cut by line-end shrink
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9984876B2May 29, 2018
Lithographic technique for feature cut by line-end shrink
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9613850B2Apr 4, 2017
Lithographic technique for feature cut by line-end shrink
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11029603B2Jun 8, 2021
Chemical replacement system
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations69
US12278230B2Apr 15, 2025
Method of manufacturing conductors for semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12025533B2Jul 2, 2024
System and method for liquid leak detection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11899368B2Feb 13, 2024
Manufacturing method of semiconductor device and semiconductor processing system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11454891B2Sep 27, 2022
Manufacturing method of semiconductor device and semiconductor processing system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11199466B2Dec 14, 2021
System and method for liquid leak detection
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
US11061333B2Jul 13, 2021
Manufacturing method of semiconductor device and semiconductor processing system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11004709B2May 11, 2021
Method for monitoring gas in wafer processing system
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
US10943802B2Mar 9, 2021
Photoresist bottle container
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations59
US10763113B2Sep 1, 2020
Lithographic technique for feature cut by line-end shrink
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52