Inventor · disambiguated record

Jean-Louis Lassorie

Also filed as: LABORIE JEAN-LOUIS

1 granted patent·29 citations·filing 1993–1993

43Inventor score

Technology areasG01R

Files withSGS THOMSON MICROELECTRONICS1

Top patents by PatentIndex Score

1 record

0160US5515382AProcess for testing the operation of an application specific integrated circuit and application specific integrated circuit relating theretoSGS THOMSON MICROELECTRONICS·Filed 1993·Granted May 7, 1996·29 cites·40 claims

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