Inventor · disambiguated record

Jun Simizu

Also filed as: SIMIZU JUN

1 granted patent·31 citations·filing 2000–2000

44Inventor score

Technology areasH10P

Files withNEC MACHINERY CORP1

Top patents by PatentIndex Score

1 record

0171US6445201B1IC package testing device and method for testing IC package using the sameNEC MACHINERY CORP·Filed 2000·Granted Sep 3, 2002·31 cites·20 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →