Inventor · disambiguated record
A.R.K. Vamsee
Also filed as: VAMSEE A R K
1 granted patent·2 pending applications·6 citations·filing 2006–2012
27Inventor score
Top patents by PatentIndex Score
3 records- 0168US9213624B2Application quality parameter measurement-based developmentNAIR MINI·Filed 2012·Granted Dec 15, 2015·6 cites·20 claims
- 0244US2013326465A1Portable Device Application Quality Parameter Measurement-Based RatingsJAIN ALOK·Filed 2012·Application pending·0 cites
- 0328US2007174717A1Approach for testing instruction TLB using user/application level techniquesSUN MICROSYSTEMS INC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →