Inventor · disambiguated record
Aaron R. Wilson
Also filed as: WILSON AARON · WILSON AARON R
42 granted patents·5 pending applications·317 citations·filing 1998–2023
98Inventor score
Top patents by PatentIndex Score
47 records- 0196US10381377B2Elevationally-extending strings of memory cells individually comprising a programmable charge storage transistor and methods of processing silicon nitride-comprising materialsMICRON TECHNOLOGY INC·Filed 2018·Granted Aug 13, 2019·14 cites·14 claims
- 0296US9893083B1Elevationally-extending strings of memory cells individually comprising a programmable charge storage transistor and methods of processing silicon nitride-comprising materialsMICRON TECHNOLOGY INC·Filed 2016·Granted Feb 13, 2018·18 cites·20 claims
- 0395US7608195B2High aspect ratio contactsMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 27, 2009·25 cites·30 claims
- 0494US8093725B2High aspect ratio contactsWILSON AARON R·Filed 2009·Granted Jan 10, 2012·22 cites·19 claims
- 0591US9305938B2Methods of fabricating integrated structures, and methods of forming vertically-stacked memory cellsMICRON TECHNOLOGY INC·Filed 2015·Granted Apr 5, 2016·6 cites·9 claims
- 0690US6464890B2Method for patterning high density field emitter tipsMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 15, 2002·27 cites·47 claims
- 0789US7879659B2Methods of fabricating semiconductor devices including dual fin structuresMICRON TECHNOLOGY INC·Filed 2007·Granted Feb 1, 2011·14 cites·34 claims
- 0888US7713430B2Using positive DC offset of bias RF to neutralize charge build-up of etch featuresMICRON TECHNOLOGY INC·Filed 2006·Granted May 11, 2010·10 cites·20 claims
- 0988US6649469B1Methods of forming capacitorsMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 18, 2003·35 cites·65 claims
- 1087US9219001B2Methods of forming semiconductor devices having recessesMICRON TECHNOLOGY INC·Filed 2013·Granted Dec 22, 2015·6 cites·19 claims
- 1186US8419958B2Using positive DC offset of bias RF to neutralize charge build-up of etch featuresWILSON AARON R·Filed 2010·Granted Apr 16, 2013·6 cites·19 claims
- 1285US6679998B2Method for patterning high density field emitter tipsMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 20, 2004·17 cites·47 claims
- 1383US8138526B2Semiconductor structures including dual finsWILSON AARON R·Filed 2010·Granted Mar 20, 2012·5 cites·17 claims
- 1481US11380705B2Integrated assemblies, and methods of forming integrated assembliesMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 5, 2022·1 cites·14 claims
- 1580US8946076B2Methods of fabricating integrated structures, and methods of forming vertically-stacked memory cellsMICRON TECHNOLOGY INC·Filed 2013·Granted Feb 3, 2015·4 cites·26 claims
- 1680US7648915B2Methods of forming semiconductor constructions, and methods of recessing materials within openingsMICRON TECHNOLOGY INC·Filed 2007·Granted Jan 19, 2010·5 cites·52 claims
- 1779US12477734B2Integrated assemblies and methods of forming integrated assembliesMICRON TECHNOLOGY INC·Filed 2022·Granted Nov 18, 2025·0 cites·20 claims
- 1876US6933193B2Method of forming a capacitorMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 23, 2005·16 cites·16 claims
- 1975US7857982B2Methods of etching features into substratesMICRON TECHNOLOGY INC·Filed 2005·Granted Dec 28, 2010·5 cites·20 claims
- 2074US6753643B2Method for forming uniform sharp tips for use in a field emission arrayMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 22, 2004·6 cites·32 claims
- 2173US6555402B2Self-aligned field extraction grid and method of formingMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 29, 2003·8 cites·25 claims
- 2271US6416376B1Method for forming uniform sharp tips for use in a field emission arrayMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 9, 2002·5 cites·42 claims
- 2369US11563024B2Integrated assemblies and methods of forming integrated assembliesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 24, 2023·0 cites·16 claims
- 2468US7276409B2Method of forming a capacitorMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 2, 2007·2 cites·16 claims
- 2568US6391670B1Method of forming a self-aligned field extraction gridMICRON TECHNOLOGY INC·Filed 1999·Granted May 21, 2002·17 cites·20 claims
- 2667US11744076B2Integrated assemblies, and methods of forming integrated assembliesMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 29, 2023·0 cites·21 claims
- 2767US6350388B1Method for patterning high density field emitter tipsMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 26, 2002·14 cites·44 claims
- 2865US8497530B2Semiconductor structures including dual finsWILSON AARON R·Filed 2012·Granted Jul 30, 2013·1 cites·13 claims
- 2965US6461526B1Method for forming uniform sharp tips for use in a field emission arrayMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 8, 2002·3 cites·38 claims
- 3065US2025222713A1Water-based de-metallization resistSUN CHEMICAL BV·Filed 2023·Application pending·0 cites
- 3164US10615174B2Elevationally-extending strings of memory cells individually comprising a programmable charge storage transistor and methods of processing silicon nitride-comprising materialsMICRON TECHNOLOGY INC·Filed 2019·Granted Apr 7, 2020·0 cites·11 claims
- 3261US8759228B2Chemistry and compositions for manufacturing integrated circuitsWILSON AARON·Filed 2007·Granted Jun 24, 2014·2 cites·24 claims
- 3361US6689282B2Method for forming uniform sharp tips for use in a field emission arrayMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 10, 2004·2 cites·41 claims
- 3460US10121799B2Elevationally-extending strings of memory cells individually comprising a programmable charge storage transistor and methods of processing silicon nitride-comprising materialsMICRON TECHNOLOGY INC·Filed 2017·Granted Nov 6, 2018·0 cites·12 claims
- 3560US6660173B2Method for forming uniform sharp tips for use in a field emission arrayMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 9, 2003·2 cites·38 claims
- 3659US7808041B2Semiconductor constructions of memory device with different depth gate line trenchesMICRON TECHNOLOGY INC·Filed 2009·Granted Oct 5, 2010·0 cites·11 claims
- 3754US9136278B2Methods of forming vertically-stacked memory cellsMICRON TECHNOLOGY INC·Filed 2013·Granted Sep 15, 2015·0 cites·11 claims
- 3854US2013220549A1Using positive dc offset of bias rf to neutralize charge build-up of etch featuresMICRON TECHNOLOGY INC·Filed 2013·Application pending·0 cites
- 3954US2014264152A1Chemistry and Compositions for Manufacturing Integrated CircuitsMICRON TECHNOLOGY INC·Filed 2014·Application pending·0 cites
- 4051US7948030B2Semiconductor constructions of memory devices with different sizes of GateLine trenchesMICRON TECHNOLOGY INC·Filed 2010·Granted May 24, 2011·0 cites·11 claims
- 4151US6171164B1Method for forming uniform sharp tips for use in a field emission arrayMICRON TECHNOLOGY INC·Filed 1998·Granted Jan 9, 2001·5 cites·38 claims
- 4251US6143580AMethods of forming a mask pattern and methods of forming a field emitter tip maskMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 7, 2000·14 cites·27 claims
- 4351US2012104550A1High aspect ratio contactsWILSON AARON R·Filed 2012·Application pending·0 cites
- 4450US7358146B2Method of forming a capacitorMICRON TECHNOLOGY INC·Filed 2005·Granted Apr 15, 2008·0 cites·47 claims
- 4549US7670958B2Etching methodsMICRON TECHNOLOGY INC·Filed 2006·Granted Mar 2, 2010·0 cites·16 claims
- 4640US6358763B1Methods of forming a mask pattern and methods of forming a field emitter tip maskMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 19, 2002·0 cites·20 claims
- 4739US2004219790A1Etching methods, RIE methods, and methods of increasing the stability of photoresist during RIEWILSON AARON R·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →