Inventor · disambiguated record
Abram M. Detofsky
Also filed as: DETOFSKY ABRAM M
15 granted patents·4 pending applications·97 citations·filing 2004–2024
91Inventor score
Top patents by PatentIndex Score
19 records- 0196US9869714B2Integrated circuit test temperature control mechanismINTEL CORP·Filed 2016·Granted Jan 16, 2018·9 cites·12 claims
- 0295US9400291B2Integrated circuit test temperature control mechanismJOHNSON JOHN C·Filed 2012·Granted Jul 26, 2016·15 cites·18 claims
- 0390US8926196B2Method and apparatus for an optical interconnect systemINTEL CORP·Filed 2012·Granted Jan 6, 2015·13 cites·17 claims
- 0489US7233163B2Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuitINTEL CORP·Filed 2006·Granted Jun 19, 2007·17 cites·6 claims
- 0585US9059803B2Mechanism for facilitating an optical instrumentation testing system employing multiple testing pathsDETOFSKY ABRAM M·Filed 2012·Granted Jun 16, 2015·12 cites·24 claims
- 0684US8710858B2Micro positioning test socket and methods for active precision alignment and co-planarity feedbackDETOFSKY ABRAM M·Filed 2010·Granted Apr 29, 2014·7 cites·14 claims
- 0778US7071723B2Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuitINTEL CORP·Filed 2004·Granted Jul 4, 2006·19 cites·8 claims
- 0877US10677845B2Converged test platforms and processes for class and system testing of integrated circuitsINTEL CORP·Filed 2017·Granted Jun 9, 2020·2 cites·28 claims
- 0975US9255945B2Micro positioning test socket and methods for active precision alignment and co-planarity feedbackINTEL CORP·Filed 2014·Granted Feb 9, 2016·2 cites·6 claims
- 1075US2025020874A1Stackable photonics die with direct optical interconnectINTEL CORP·Filed 2024·Application pending·0 cites
- 1164US12135460B2Stackable photonics die with direct optical interconnectINTEL CORP·Filed 2020·Granted Nov 5, 2024·0 cites·22 claims
- 1258US12061230B2Active optical plug to optically or electrically test a photonics packageINTEL CORP·Filed 2020·Granted Aug 13, 2024·0 cites·20 claims
- 1358US10247773B2Systems and methods for wireless device testingINTEL CORP·Filed 2016·Granted Apr 2, 2019·1 cites·14 claims
- 1456US2019293707A1Stacked instrument architecture for testing and validation of electronic circuitsINTEL CORP·Filed 2017·Application pending·0 cites
- 1554US2018188288A1Stacked instrument architecture for testing and validation of electronic circuitsINTEL CORP·Filed 2016·Application pending·0 cites
- 1647US2022196924A1Pierceable protective cover for photonic connectorsINTEL CORP·Filed 2020·Application pending·0 cites
- 1742US10324112B2Package testing system and method with contact alignmentINTEL CORP·Filed 2016·Granted Jun 18, 2019·0 cites·18 claims
- 1840US9506980B2Integrated circuit testing architectureDETOFSKY ABRAM M·Filed 2013·Granted Nov 29, 2016·0 cites·22 claims
- 1936US10295406B2Increased processing efficiency for optical spectral analyzersINTEL CORP·Filed 2017·Granted May 21, 2019·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →