Inventor · disambiguated record
Adriaan Tiemen Zuiderweg
Also filed as: ZUIDERWEG ADRIAAN TIEMEN
4 granted patents·2 pending applications·11 citations·filing 2014–2020
65Inventor score
Files withMITUTOYO CORP6
Top patents by PatentIndex Score
6 records- 0183US9881400B2Method for measuring a high accuracy height map of a test surfaceMITUTOYO CORP·Filed 2015·Granted Jan 30, 2018·9 cites·20 claims
- 0267US10794688B2Optical interference measuring deviceMITUTOYO CORP·Filed 2019·Granted Oct 6, 2020·1 cites·11 claims
- 0362US10563974B2Method for measuring a height map of multiple fields of view and combining them to a composite height map with minimized sensitivity to instrument driftMITUTOYO CORP·Filed 2016·Granted Feb 18, 2020·1 cites·12 claims
- 0451US2018031415A1Interferometer system having a continuously variable broadband reflector and method to generate an interference signal of a surface of a sampleMITUTOYO CORP·Filed 2017·Application pending·0 cites
- 0550US2014362383A1Interferometer system and method to generate an interference signal of a surface of a sampleMITUTOYO CORP·Filed 2014·Application pending·0 cites
- 0640US11493330B2Method for measuring a height map of a test surfaceMITUTOYO CORP·Filed 2020·Granted Nov 8, 2022·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →