Inventor · disambiguated record

Afif Farhat

Also filed as: FARHAT AFIF

1 granted patent·27 citations·filing 2001–2001

43Inventor score

Technology areasG01R

Files withNAT SEMICONDUCTOR CORP1

Top patents by PatentIndex Score

1 record

0173US7062696B2Algorithmic test pattern generator, with built-in-self-test (BIST) capabilities, for functional testing of a circuitNAT SEMICONDUCTOR CORP·Filed 2001·Granted Jun 13, 2006·27 cites·16 claims

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