Inventor · disambiguated record

Ahmad Alvamani

Also filed as: ALVAMANI AHMAD · ALVAMANI AHMAD A

2 granted patents·29 citations·filing 2004–2005

60Inventor score

Technology areasG01R

Files withLSI LOGIC CORP2

Top patents by PatentIndex Score

2 records

0189US7555688B2Method for implementing test generation for systematic scan reconfiguration in an integrated circuitLSI LOGIC CORP·Filed 2005·Granted Jun 30, 2009·24 cites·16 claims
0250US7210083B2System and method for implementing postponed quasi-masking test output compression in integrated circuitLSI LOGIC CORP·Filed 2004·Granted Apr 24, 2007·5 cites·21 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →