Inventor · disambiguated record

Ahn N. Hoang

Also filed as: HOANG ANH N

1 granted patent·15 citations·filing 1999–1999

38Inventor score

Technology areasB24B

Files withLUXTRON CORP1

Top patents by PatentIndex Score

1 record

0153US6570662B1Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafersLUXTRON CORP·Filed 1999·Granted May 27, 2003·15 cites·7 claims

Join the waitlist — get patent alerts

Get an alert when Ahn N. Hoang files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →