Inventor · disambiguated record
Ahjin Jo
Also filed as: JO AHJIN
4 granted patents·2 pending applications·0 citations·filing 2020–2023
54Inventor score
Files withPARK SYSTEMS CORP6
Top patents by PatentIndex Score
6 records- 0176US12038455B2Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light sourcePARK SYSTEMS CORP·Filed 2023·Granted Jul 16, 2024·0 cites·4 claims
- 0262US11598788B2Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light sourcePARK SYSTEMS CORP·Filed 2021·Granted Mar 7, 2023·0 cites·3 claims
- 0349US12399195B2Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same methodPARK SYSTEMS CORP·Filed 2021·Granted Aug 26, 2025·0 cites·11 claims
- 0448US11175308B2Chip carrier exchanging device and atomic force microscopy apparatus having samePARK SYSTEMS CORP·Filed 2020·Granted Nov 16, 2021·0 cites·8 claims
- 0539US2023324434A1Method for measuring characteristics of surface of object to be measured by means of measuring apparatus using variable set point setting, atomic microscope for performing method, and computer program stored in storage medium for performing methodPARK SYSTEMS CORP·Filed 2021·Application pending·0 cites
- 0638US2023046236A1Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform methodPARK SYSTEMS CORP·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →