Inventor · disambiguated record
Akihiro Banno
Also filed as: BANNO AKIHIRO
2 granted patents·1 pending application·25 citations·filing 2002–2010
57Inventor score
Top patents by PatentIndex Score
3 records- 0168US6763511B2Semiconductor integrated circuit having macro cells and designing method of the sameNEC ELECTRONICS CORP·Filed 2002·Granted Jul 13, 2004·23 cites·18 claims
- 0243US8310889B2Semiconductor deviceBANNO AKIHIRO·Filed 2010·Granted Nov 13, 2012·2 cites·8 claims
- 0329US2010027359A1Memory test circuit which tests address access time of clock synchronized memoryNEC ELECTRONICS CORP·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →