Inventor · disambiguated record
Akira Echizenya
Also filed as: ECHIZENYA AKIRA
3 granted patents·26 citations·filing 2006–2008
67Inventor score
Files withRIGAKU DENKI CO LTD3
Top patents by PatentIndex Score
3 records- 0181US7542548B2X-ray optical systemRIGAKU DENKI CO LTD·Filed 2007·Granted Jun 2, 2009·18 cites·7 claims
- 0278US7860217B2X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the sameRIGAKU DENKI CO LTD·Filed 2008·Granted Dec 28, 2010·6 cites·14 claims
- 0325USD566278SX-ray analysis deviceRIGAKU DENKI CO LTD·Filed 2006·Granted Apr 8, 2008·2 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →