Inventor · disambiguated record
Akihiro Funyu
Also filed as: FUNYU AKIHIRO
13 granted patents·1 pending application·279 citations·filing 1999–2010
93Inventor score
Top patents by PatentIndex Score
14 records- 0193US6353561B1Semiconductor integrated circuit and method for controlling the sameFUJITSU LTD·Filed 1999·Granted Mar 5, 2002·109 cites·10 claims
- 0288US8111575B2Semiconductor deviceMORI KAORU·Filed 2010·Granted Feb 7, 2012·14 cites·20 claims
- 0388US6535950B1Semiconductor memory device having a refresh operationFUJITSU LTD·Filed 2000·Granted Mar 18, 2003·44 cites·7 claims
- 0480US7113441B2Semiconductor memoryFUJITSU LTD·Filed 2005·Granted Sep 26, 2006·11 cites·27 claims
- 0577US6396758B2Semiconductor memory deviceFUJITSU LTD·Filed 2001·Granted May 28, 2002·24 cites·11 claims
- 0677US6292426B1Semiconductor memory device having an SRAM and a DRAM on a single chipFUJITSU LTD·Filed 2000·Granted Sep 18, 2001·22 cites·7 claims
- 0770US7471585B2Semiconductor memoryFUJITSU LTD·Filed 2006·Granted Dec 30, 2008·6 cites·21 claims
- 0862US6724675B2Semiconductor memory device and electronic apparatusFUJITSU LTD·Filed 2003·Granted Apr 20, 2004·10 cites·15 claims
- 0962US6452453B1Constant-current generator, differential amplifier, and semiconductor integrated circuitFUJITSU LTD·Filed 2000·Granted Sep 17, 2002·12 cites·8 claims
- 1059US6404688B2Semiconductor memory device having a self-refresh operationFUJITSU LTD·Filed 2001·Granted Jun 11, 2002·11 cites·10 claims
- 1156US7114025B2Semiconductor memory having test function for refresh operationFUJITSU LTD·Filed 2003·Granted Sep 26, 2006·9 cites·10 claims
- 1250US6735141B2Semiconductor memory device having an SRAM and a DRAM on a single chipFUJITSU LTD·Filed 2001·Granted May 11, 2004·5 cites·4 claims
- 1333US6496433B2Semiconductor device and semiconductor device testing methodFUJITSU LTD·Filed 2001·Granted Dec 17, 2002·2 cites·6 claims
- 1431US2001017791A1Dynamic random access memory (DRAM) having ATD circuitFUJITSU LTD·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →