Inventor · disambiguated record
Akira Hamaguchi
Also filed as: HAMAGUCHI AKIRA
9 granted patents·5 pending applications·139 citations·filing 1984–2024
87Inventor score
Files withTOSHIBA KK4RENESAS ELECTRONICS CORP3HITACHI HIGH TECH CORP2FUJI PHOTO FILM CO LTD1HAMAGUCHI AKIRA1
Top patents by PatentIndex Score
14 records- 0188US10943048B2Defect inspection apparatus and defect inspection methodTOSHIBA MEMORY CORP·Filed 2019·Granted Mar 9, 2021·6 cites·15 claims
- 0278US11545336B2Scanning electron microscopy system and pattern depth measurement methodHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 3, 2023·2 cites·5 claims
- 0377US11302513B2Electron microscope apparatus, inspection system using electron microscope apparatus, and inspection method using electron microscope apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 12, 2022·1 cites·8 claims
- 0476US5276805AImage filing system which has retrieval data containing link information between image dataFUJI PHOTO FILM CO LTD·Filed 1990·Granted Jan 4, 1994·81 cites·2 claims
- 0570US7600213B2Pattern data verification method, pattern data creation method, exposure mask manufacturing method, semiconductor device manufacturing method, and computer program productTOSHIBA KK·Filed 2005·Granted Oct 6, 2009·5 cites·16 claims
- 0662US4622827AControl apparatus for an air conditionerMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1984·Granted Nov 18, 1986·28 cites·13 claims
- 0762US2024210334A1Measurement device, measurement system, and measurement methodKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0861US8027812B2Charge trajectory calculating method, system, and programTOSHIBA KK·Filed 2008·Granted Sep 27, 2011·2 cites·18 claims
- 0959US7302091B2Method and apparatus for determining defect detection sensitivity data, control method of defect detection apparatus, and method and apparatus for detecting defect of semiconductor devicesTOSHIBA KK·Filed 2003·Granted Nov 27, 2007·14 cites·26 claims
- 1054US2025138941A1Semiconductor device, reading method and programRENESAS ELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1149US9053904B2Image quality adjusting method, non-transitory computer-readable recording medium, and electron microscopeTOSHIBA KK·Filed 2013·Granted Jun 9, 2015·0 cites·20 claims
- 1249US2024232383A9Semiconductor device and method of managing secret informationRENESAS ELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 1346US2012065941A1Charge trajectory calculating method, system, and programHAMAGUCHI AKIRA·Filed 2011·Application pending·0 cites
- 1446US2024089097A1Key update management system and key update management methodRENESAS ELECTRONICS CORP·Filed 2022·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Akira Hamaguchi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →