Inventor · disambiguated record
Akihiro Himeda
Also filed as: HIMEDA AKIHIRO
9 granted patents·3 pending applications·54 citations·filing 2005–2024
83Inventor score
Top patents by PatentIndex Score
12 records- 0193US7130373B2Method and apparatus for film thickness measurementRIGAKU DENKI CO LTD·Filed 2005·Granted Oct 31, 2006·42 cites·7 claims
- 0291US10161888B2Crystalline phase identification method, crystalline phase identification device, and X-ray diffraction measurement systemRIGAKU DENKI CO LTD·Filed 2017·Granted Dec 25, 2018·6 cites·12 claims
- 0382US12174131B2Quantitative analysis apparatus, method and program and manufacturing control systemRIGAKU DENKI CO LTD·Filed 2022·Granted Dec 24, 2024·1 cites·11 claims
- 0478US10801976B2Method for displaying measurement results from x-ray diffraction measurementRIGAKU DENKI CO LTD·Filed 2018·Granted Oct 13, 2020·1 cites·5 claims
- 0577US10962489B2Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis programRIGAKU DENKI CO LTD·Filed 2018·Granted Mar 30, 2021·1 cites·17 claims
- 0675US10876979B2Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffractionRIGAKU DENKI CO LTD·Filed 2017·Granted Dec 29, 2020·1 cites·6 claims
- 0762US8971492B2Analysis method for X-ray diffraction measurement dataSASAKI AKITO·Filed 2012·Granted Mar 3, 2015·2 cites·7 claims
- 0860US2024133829A1Processing apparatus, system, method, and program for applying non-negative matrix factorization to a measured profile of x-ray powder diffractionRIGAKU DENKI CO LTD·Filed 2023·Application pending·0 cites
- 0952US2025076225A1Information processing system, information processing method and programRIGAKU DENKI CO LTD·Filed 2024·Application pending·0 cites
- 1046US2014278147A1Crystalline phase identification method, crystalline phase identification device, and crystalline phase identification programRIGAKU DENKI CO LTD·Filed 2014·Application pending·0 cites
- 1143US10393679B2Operation guide system for X-ray analysis,operation guide method therefor, and operation guide program thereforRIGAKU DENKI CO LTD·Filed 2017·Granted Aug 27, 2019·0 cites·9 claims
- 1241US11300529B2Analysis apparatus, analysis method and analysis programRIGAKU DENKI CO LTD·Filed 2017·Granted Apr 12, 2022·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →