Inventor · disambiguated record
Akihiro Ishizuka
Also filed as: ISHIZUKA AKIHIRO
42 granted patents·2 pending applications·251 citations·filing 2005–2023
97Inventor score
Top patents by PatentIndex Score
44 records- 0196US11477422B2Image processing device, projection system, image processing method, and image processing programFUJIFILM CORP·Filed 2021·Granted Oct 18, 2022·5 cites·16 claims
- 0295US10079295B2Semiconductor device and method for manufacturing thereofSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Sep 18, 2018·12 cites·15 claims
- 0395US8916868B2Semiconductor device and method for manufacturing semiconductor deviceISOBE ATSUO·Filed 2012·Granted Dec 23, 2014·23 cites·9 claims
- 0494US9006803B2Semiconductor device and method for manufacturing thereofISOBE ATSUO·Filed 2012·Granted Apr 14, 2015·17 cites·10 claims
- 0594US8946812B2Semiconductor device and manufacturing method thereofISHIZUKA AKIHIRO·Filed 2012·Granted Feb 3, 2015·20 cites·14 claims
- 0694US8637864B2Semiconductor device and method of manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2012·Granted Jan 28, 2014·17 cites·18 claims
- 0793US11695906B2Image processing device, projection system, image processing method, and image processing programFUJIFILM CORP·Filed 2021·Granted Jul 4, 2023·3 cites·20 claims
- 0893US9166019B2Semiconductor device and method of manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Oct 20, 2015·13 cites·20 claims
- 0992US8932913B2Manufacturing method of semiconductor deviceSASAGAWA SHINYA·Filed 2012·Granted Jan 13, 2015·16 cites·16 claims
- 1092US8703560B2Methods for manufacturing thin film transistorSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Apr 22, 2014·11 cites·20 claims
- 1192US8501554B2Methods for manufacturing thin film transistor and display deviceSEMICONDUCTOR ENERGY LAB·Filed 2012·Granted Aug 6, 2013·12 cites·10 claims
- 1290US9431545B2Semiconductor device and method for manufacturing the sameSAITO TOSHIHIKO·Filed 2012·Granted Aug 30, 2016·13 cites·8 claims
- 1388US9252103B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Feb 2, 2016·9 cites·16 claims
- 1487US8906737B2Method for manufacturing semiconductor deviceISHIZUKA AKIHIRO·Filed 2011·Granted Dec 9, 2014·10 cites·13 claims
- 1587US8592879B2Method for manufacturing semiconductor deviceSUZAWA HIDEOMI·Filed 2011·Granted Nov 26, 2013·8 cites·21 claims
- 1687US8349671B2Methods for manufacturing thin film transistor and display deviceSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Jan 8, 2013·11 cites·24 claims
- 1786US8664118B2Semiconductor device and method for manufacturing the sameISHIZUKA AKIHIRO·Filed 2012·Granted Mar 4, 2014·8 cites·17 claims
- 1885US9559193B2Semiconductor device and method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Jan 31, 2017·5 cites·22 claims
- 1984US7563658B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted Jul 21, 2009·9 cites·19 claims
- 2083US11800071B2Control device, projection apparatus, control method, and control programFUJIFILM CORP·Filed 2022·Granted Oct 24, 2023·1 cites·32 claims
- 2183US8575608B2Thin film transistor and manufacturing method thereofSASAGAWA SHINYA·Filed 2010·Granted Nov 5, 2013·7 cites·22 claims
- 2281US8227278B2Methods for manufacturing thin film transistor and display deviceSASAGAWA SHINYA·Filed 2009·Granted Jul 24, 2012·8 cites·32 claims
- 2379US7547627B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted Jun 16, 2009·5 cites·27 claims
- 2473US12462419B2Instruction position detection device, instruction position detection method, instruction position detection program, and projection systemFUJIFILM CORP·Filed 2023·Granted Nov 4, 2025·0 cites·16 claims
- 2573US9805954B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Oct 31, 2017·2 cites·10 claims
- 2672US9105749B2Semiconductor device and manufacturing method thereofSASAGAWA SHINYA·Filed 2012·Granted Aug 11, 2015·3 cites·16 claims
- 2770US8969144B2Method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Mar 3, 2015·2 cites·13 claims
- 2868US11627295B2Image processing device, projection system, image processing method, and image processing programFUJIFILM CORP·Filed 2022·Granted Apr 11, 2023·0 cites·16 claims
- 2965US12461332B2Projection apparatus, projection method, and control programFUJIFILM CORP·Filed 2022·Granted Nov 4, 2025·0 cites·15 claims
- 3064US11956573B2Image processing device, projection system, image processing method, and image processing programFUJIFILM CORP·Filed 2023·Granted Apr 9, 2024·0 cites·10 claims
- 3164US8124544B2Method for manufacturing semiconductor deviceOKAMOTO SATORU·Filed 2009·Granted Feb 28, 2012·1 cites·34 claims
- 3263US11796899B2Control device, projection apparatus, control method, and control programFUJIFILM CORP·Filed 2022·Granted Oct 24, 2023·0 cites·23 claims
- 3360US12112664B2Control device, control method, control program, and projection systemFUJIFILM CORP·Filed 2023·Granted Oct 8, 2024·0 cites·16 claims
- 3458US12363267B2Control method, projection apparatus, and control programFUJIFILM CORP·Filed 2022·Granted Jul 15, 2025·0 cites·24 claims
- 3557US11908354B2Control device, projection apparatus, control method, and control programFUJIFILM CORP·Filed 2022·Granted Feb 20, 2024·0 cites·5 claims
- 3657US11889238B2Projection apparatus, projection method, and control programFUJIFILM CORP·Filed 2022·Granted Jan 30, 2024·0 cites·15 claims
- 3754US12041392B2Projection system, projection method, and control programFUJIFILM CORP·Filed 2022·Granted Jul 16, 2024·0 cites·22 claims
- 3854US11587534B2Projection control device, projection apparatus, projection control method, and projection control programFUJIFILM CORP·Filed 2021·Granted Feb 21, 2023·0 cites·19 claims
- 3952US12207028B2Control device, projection system, control method, and control programFUJIFILM CORP·Filed 2022·Granted Jan 21, 2025·0 cites·32 claims
- 4052US11930306B2Projection apparatus, projection method, and control programFUJIFILM CORP·Filed 2022·Granted Mar 12, 2024·0 cites·9 claims
- 4150US11895446B2Control device, control method, control program, and projection systemFUJIFILM CORP·Filed 2022·Granted Feb 6, 2024·0 cites·24 claims
- 4248US8247308B2Method for manufacturing SOI substrateISHIZUKA AKIHIRO·Filed 2009·Granted Aug 21, 2012·0 cites·16 claims
- 4347US2023064575A1Control method, projection apparatus, and control programFUJIFILM CORP·Filed 2022·Application pending·0 cites
- 4446US2022377295A1Projection apparatus, projection method, and control programFUJIFILM CORP·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →