Inventor · disambiguated record
Akihiro Iwase
Also filed as: IWASE AKIHIRO
12 granted patents·243 citations·filing 1989–2006
92Inventor score
Files withFUJITSU LTD12
Top patents by PatentIndex Score
12 records- 0192US6762617B2Semiconductor device having test mode entry circuitFUJITSU LTD·Filed 2002·Granted Jul 13, 2004·47 cites·15 claims
- 0288US6651196B1Semiconductor device having test mode entry circuitFUJITSU LTD·Filed 2000·Granted Nov 18, 2003·45 cites·40 claims
- 0387US6885212B2Semiconductor device and test method for the sameFUJITSU LTD·Filed 2003·Granted Apr 26, 2005·36 cites·23 claims
- 0486US7330043B2Semiconductor device and test method for the sameFUJITSU LTD·Filed 2005·Granted Feb 12, 2008·15 cites·14 claims
- 0569US7474143B2Voltage generator circuit and method for controlling thereofFUJITSU LTD·Filed 2006·Granted Jan 6, 2009·6 cites·15 claims
- 0665US5747837ASemiconductor device having input protective functionFUJITSU LTD·Filed 1996·Granted May 5, 1998·26 cites·5 claims
- 0763US5097159ADelay circuit for delaying an output signal relative to an input signal for a specified time intervalFUJITSU LTD·Filed 1989·Granted Mar 17, 1992·16 cites·45 claims
- 0860US5719812ASemiconductor memory including bit line reset circuitry and a pulse generator having output delay time dependent on type of transition in an input signalFUJITSU LTD·Filed 1996·Granted Feb 17, 1998·25 cites·4 claims
- 0951US7095273B2Voltage generator circuit and method for controlling thereofFUJITSU LTD·Filed 2002·Granted Aug 22, 2006·6 cites·13 claims
- 1044US5631865AData outputting circuit for semiconductor memory deviceFUJITSU LTD·Filed 1995·Granted May 20, 1997·12 cites·14 claims
- 1139US5475639ASemiconductor memory device with improved speed for reading dataFUJITSU LTD·Filed 1994·Granted Dec 12, 1995·7 cites·9 claims
- 1228US5453956ALoad generator used in semiconductor memory deviceFUJITSU LTD·Filed 1995·Granted Sep 26, 1995·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →