Inventor · disambiguated record
Akihiko Kagami
Also filed as: KAGAMI AKIHIKO
10 granted patents·2 pending applications·159 citations·filing 1989–2010
90Inventor score
Top patents by PatentIndex Score
12 records- 0186US5563832ASemiconductor memory device having interface units memorizing available memory cell sub-arraysNEC CORP·Filed 1994·Granted Oct 8, 1996·74 cites·6 claims
- 0279US8363496B2Semiconductor memory device performing refresh operation and method of testing the sameELPIDA MEMORY INC·Filed 2010·Granted Jan 29, 2013·7 cites·13 claims
- 0351US5347491ADynamic random access memory device having autorefreshing unit for producing internal row address strobe signal and internal column address strobe signalNEC CORP·Filed 1992·Granted Sep 13, 1994·16 cites·4 claims
- 0448US5394369ASemiconductor memory device incorporating redundancy memory cells having parallel test functionNEC CORP·Filed 1993·Granted Feb 28, 1995·14 cites·2 claims
- 0546US4975881ASemiconductor memory device provided with an improved redundant decoderNEC CORP·Filed 1989·Granted Dec 4, 1990·11 cites·5 claims
- 0645US5091884ASemiconductor memory device with improved address discriminating circuit for discriminating an address assigned defective memory cell replaced with redundant memory cellNEC CORP·Filed 1990·Granted Feb 25, 1992·12 cites·5 claims
- 0741US5295099ADynamic random access memory device having static column mode of operation without destruction of data bitNEC CORP·Filed 1992·Granted Mar 15, 1994·10 cites·5 claims
- 0839US5940331AOutput circuit of semiconductor memory deviceNEC CORP·Filed 1998·Granted Aug 17, 1999·8 cites·5 claims
- 0937US2011058438A1Semiconductor memory device and refresh control method of memory systemELPIDA MEMORY INC·Filed 2010·Application pending·0 cites
- 1036US7606094B2Semiconductor memory device and control method thereofELPIDA MEMORY INC·Filed 2007·Granted Oct 20, 2009·1 cites·18 claims
- 1136US2010128547A1Semiconductor memory device and refresh control method of memory systemELPIDA MEMORY INC·Filed 2006·Application pending·0 cites
- 1234US5629944ATest mode setting circuit of test circuit for semiconductor memoryNEC CORP·Filed 1996·Granted May 13, 1997·6 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →