Inventor · disambiguated record
Akihiro Katanishi
Also filed as: KATANISHI AKIHIRO
3 granted patents·53 citations·filing 2005–2016
68Inventor score
Files withHORIBA LTD3
Top patents by PatentIndex Score
3 records- 0191US7327444B2Substrate inspection apparatus and methodHORIBA LTD·Filed 2005·Granted Feb 5, 2008·34 cites·22 claims
- 0285US7295307B2Method of and apparatus for measuring stress of semiconductor materialHORIBA LTD·Filed 2005·Granted Nov 13, 2007·19 cites·20 claims
- 0338US9645059B2Sample introduction system and particle size distribution measuring apparatusHORIBA LTD·Filed 2016·Granted May 9, 2017·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →