Inventor · disambiguated record
Akihide Kimura
Also filed as: KIMURA AKIHIDE
25 granted patents·2 pending applications·14 citations·filing 2012–2023
91Inventor score
Files withMITUTOYO CORP27
Top patents by PatentIndex Score
27 records- 0190US10302466B2Contamination and defect resistant optical encoder configuration including first and second illumination source diffraction gratings arranged in first and second parallel planes for providing displacement signalsMITUTOYO CORP·Filed 2017·Granted May 28, 2019·6 cites·6 claims
- 0280US10190892B2EncoderMITUTOYO CORP·Filed 2016·Granted Jan 29, 2019·2 cites·11 claims
- 0377US10627215B1Optical sensorMITUTOYO CORP·Filed 2019·Granted Apr 21, 2020·2 cites·19 claims
- 0471US10094685B2Displacement encoderMITUTOYO CORP·Filed 2016·Granted Oct 9, 2018·1 cites·14 claims
- 0570US10168189B1Contamination and defect resistant optical encoder configuration for providing displacement signal having a plurality of spatial phase detectors arranged in a spatial phase sequence along a direction transverse to the measuring axisMITUTOYO CORP·Filed 2017·Granted Jan 1, 2019·1 cites·19 claims
- 0668US9534936B2Reference signal generation apparatus and reference signal generation systemMITUTOYO CORP·Filed 2014·Granted Jan 3, 2017·2 cites·6 claims
- 0764US11686570B2Displacement sensor and profile measurement apparatusMITUTOYO CORP·Filed 2021·Granted Jun 27, 2023·0 cites·15 claims
- 0859US2024110816A1Optical encoderMITUTOYO CORP·Filed 2023·Application pending·0 cites
- 0958US10859374B2Optical angle sensorMITUTOYO CORP·Filed 2019·Granted Dec 8, 2020·0 cites·12 claims
- 1055US12467772B2Optical encoder with a beam-shaping elementMITUTOYO CORP·Filed 2023·Granted Nov 11, 2025·0 cites·6 claims
- 1152US11598629B2Optical displacement sensorMITUTOYO CORP·Filed 2021·Granted Mar 7, 2023·0 cites·18 claims
- 1248US10831035B2Optical encoderMITUTOYO CORP·Filed 2015·Granted Nov 10, 2020·0 cites·9 claims
- 1347US11199400B2Optical angle sensorMITUTOYO CORP·Filed 2020·Granted Dec 14, 2021·0 cites·8 claims
- 1447US10274344B2Displacement encoderMITUTOYO CORP·Filed 2018·Granted Apr 30, 2019·0 cites·12 claims
- 1546US11774270B2EncoderMITUTOYO CORP·Filed 2021·Granted Oct 3, 2023·0 cites·6 claims
- 1646US10591321B2Optical encoderMITUTOYO CORP·Filed 2018·Granted Mar 17, 2020·0 cites·6 claims
- 1746US9157769B2Reference signal generation apparatus and reference signal generation systemMITUTOYO CORP·Filed 2014·Granted Oct 13, 2015·0 cites·9 claims
- 1846US2020378803A1Optical encoderMITUTOYO CORP·Filed 2020·Application pending·0 cites
- 1945US10746573B2Optical encoder and measurement device including the sameMITUTOYO CORP·Filed 2018·Granted Aug 18, 2020·0 cites·8 claims
- 2044US9134144B2Displacement detecting device, scale calibrating method and scale calibrating programMITUTOYO CORP·Filed 2012·Granted Sep 15, 2015·0 cites·9 claims
- 2144US9068863B2EncoderMITUTOYO CORP·Filed 2013·Granted Jun 30, 2015·0 cites·2 claims
- 2241US10295648B2Contamination and defect resistant optical encoder configuration including a normal of readhead plane at a non-zero pitch angle relative to measuring axis for providing displacement signalsMITUTOYO CORP·Filed 2018·Granted May 21, 2019·0 cites·9 claims
- 2341US10190893B2EncoderMITUTOYO CORP·Filed 2016·Granted Jan 29, 2019·0 cites·13 claims
- 2441US10030998B2Displacement detecting device by light retroreflectance having first and second retroreflecting units with a common light receiving unitMITUTOYO CORP·Filed 2016·Granted Jul 24, 2018·0 cites·4 claims
- 2539US10295378B2Contamination and defect resistant optical encoder configuration outputting structured illumination to a scale plane for providing displacement signalsMITUTOYO CORP·Filed 2017·Granted May 21, 2019·0 cites·20 claims
- 2639US9903742B2Displacement detecting deviceMITUTOYO CORP·Filed 2016·Granted Feb 27, 2018·0 cites·2 claims
- 2737US9587965B2Optical encoder and reference signal generation method for optical encoderMITUTOYO CORP·Filed 2015·Granted Mar 7, 2017·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →