Inventor · disambiguated record
Akinori Kinugasa
Also filed as: KINUGASA AKINORI
8 granted patents·2 pending applications·47 citations·filing 1998–2003
84Inventor score
Top patents by PatentIndex Score
10 records- 0169US6787878B1Semiconductor device having a potential fuse, and method of manufacturing the sameRENESAS TECH CORP·Filed 2000·Granted Sep 7, 2004·17 cites·1 claims
- 0255US6744143B1Semiconductor device having test markRENESAS TECH CORP·Filed 2000·Granted Jun 1, 2004·5 cites·8 claims
- 0354US6337268B1Method of manufacturing contact structureMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jan 8, 2002·7 cites·9 claims
- 0454US6313005B1Method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Nov 6, 2001·7 cites·11 claims
- 0550US6812536B2MOSFET with graded gate oxide layerRENESAS TECH CORP·Filed 2003·Granted Nov 2, 2004·5 cites·10 claims
- 0646US6673671B1Semiconductor device, and method of manufacturing the sameRENESAS TECH CORP·Filed 2000·Granted Jan 6, 2004·3 cites·3 claims
- 0735US2003038317A1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 0835US2004150030A1Semiconductor device, and method of manufacturing the sameRENESAS TECH CORP·Filed 2003·Application pending·0 cites
- 0934US6251741B1Method of manufacturing a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jun 26, 2001·3 cites·4 claims
- 1031US6512261B2Method of fabricating a semiconductor device and the semiconductor device with a capacitor structure having increased capacitanceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jan 28, 2003·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →