Inventor · disambiguated record
Akira Masuya
Also filed as: MASUYA AKIRA
12 granted patents·2 pending applications·4 citations·filing 2014–2021
80Inventor score
Files withHITACHI HIGH TECH CORP14
Top patents by PatentIndex Score
14 records- 0186US11506675B2Inspection deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 22, 2022·4 cites·14 claims
- 0269US11578300B2Test apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 14, 2023·0 cites·7 claims
- 0366US10900011B2Test apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 26, 2021·0 cites·8 claims
- 0459US12386149B2Calibration sample, manufacturing method for calibration sample, and calibration method for autofocus target positionHITACHI HIGH TECH CORP·Filed 2021·Granted Aug 12, 2025·0 cites·15 claims
- 0553US11618873B2Culture instrumentHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 4, 2023·0 cites·7 claims
- 0650US12146822B2Particle quantitative measurement deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 19, 2024·0 cites·10 claims
- 0749US11571698B2Bacterial test plate having antibacterial agent introduced thereinto, and transparent plateHITACHI HIGH TECH CORP·Filed 2018·Granted Feb 7, 2023·0 cites·10 claims
- 0844US12085704B2Microscopic image capturing method and microscopic image capturing deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Sep 10, 2024·0 cites·13 claims
- 0944US2021208172A1Analysis deviceHITACHI HIGH TECH CORP·Filed 2018·Application pending·0 cites
- 1042US12146131B2Testing apparatus and testing methodHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 19, 2024·0 cites·15 claims
- 1142US10983039B2Observation deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 20, 2021·0 cites·8 claims
- 1240US11892706B2Observation deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Feb 6, 2024·0 cites·7 claims
- 1340US10624712B2Sensitivity measuring device and inspection deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 21, 2020·0 cites·12 claims
- 1440US2017211032A1Temperature regulating containerHITACHI HIGH TECH CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →