Inventor · disambiguated record
Akira Motohara
Also filed as: MOTOHARA AKIRA
17 granted patents·6 pending applications·186 citations·filing 1990–2008
94Inventor score
Top patents by PatentIndex Score
23 records- 0177US5430736AMethod and apparatus for generating test pattern for sequential logic circuit of integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Jul 4, 1995·41 cites·28 claims
- 0268US7281136B2LSI design method and verification methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Oct 9, 2007·12 cites·6 claims
- 0366US6671857B1Method of designing integrated circuit device using common parameter at different design levels, and database thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Dec 30, 2003·10 cites·39 claims
- 0464US6668337B2Method for designing integrated circuit based on the transaction analyzing modelMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Dec 23, 2003·10 cites·24 claims
- 0561US5729553ASemiconductor integrated circuit with a testable blockMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Mar 17, 1998·20 cites·1 claims
- 0659US6523157B1Method for designing integrated circuit device and database for design of integrated circuit deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Feb 18, 2003·8 cites·11 claims
- 0758US5894482ASemiconductor integrated circuit with a testable blockMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Apr 13, 1999·18 cites·3 claims
- 0857US5305328AMethod of test sequence generationMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1990·Granted Apr 19, 1994·19 cites·9 claims
- 0953US7017135B2Method of designing semiconductor integrated circuit utilizing a scan test functionMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Mar 21, 2006·4 cites·4 claims
- 1052US6886150B2Method for designing integrated circuit deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Apr 26, 2005·2 cites·2 claims
- 1150US7148503B2Semiconductor device, function setting method thereof, and evaluation method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Dec 12, 2006·4 cites·30 claims
- 1249US2008028233A1LSI design method and verification methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 1348US2007011468A1LSI design method and verification methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 1447US2009106721A1Method of designing semiconductor integrated circuit in which fault detection can be effected through scan-in and scan-outPANASONIC CORP·Filed 2008·Application pending·0 cites
- 1546US7284134B2ID installable LSI, secret key installation method, LSI test method, and LSI development methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Oct 16, 2007·4 cites·5 claims
- 1645US2004054976A1Method of designing integrated circuit device and databaseMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Application pending·0 cites
- 1745US2006275932A1Semiconductor device, function setting method thereof, and evaluation method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 1840US2008046759A1ID installable LSI, secret key installation method, LSI test method, and LSI development methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Application pending·0 cites
- 1939US5319647AMethod and apparatus for performing automatic test pattern generationMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1990·Granted Jun 7, 1994·8 cites·26 claims
- 2038US6415416B1Method for improving the efficiency of designing a system-on-chip integrated circuit deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Jul 2, 2002·8 cites·11 claims
- 2138US6282506B1Method of designing semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Aug 28, 2001·5 cites·9 claims
- 2235US5483543ATest sequence generation methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Jan 9, 1996·5 cites·11 claims
- 2334US5617427AMethod for generating test sequences for detecting faults in target scan logical blocksMATSUSHITA ELECTCRIC IND CO LT·Filed 1995·Granted Apr 1, 1997·8 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →