Inventor · disambiguated record
Akihiko Nakano
Also filed as: NAKANO AKIHIKO
15 granted patents·1 pending application·395 citations·filing 1978–2021
93Inventor score
Files withSHARP KK8KOMATSU MFG CO LTD2MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2RIKEN2USHIO ELECTRIC INC2
Top patents by PatentIndex Score
16 records- 0196US5089774AApparatus and a method for checking a semiconductorSHARP KK·Filed 1990·Granted Feb 18, 1992·212 cites·7 claims
- 0285US4578526ASolar moduleMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1984·Granted Mar 25, 1986·61 cites·4 claims
- 0381US5132507AApparatus and a method for checking a semiconductorSHARP KK·Filed 1991·Granted Jul 21, 1992·43 cites·7 claims
- 0468US4261450AFailure detecting apparatus for a dual valveKOMATSU MFG CO LTD·Filed 1978·Granted Apr 14, 1981·16 cites·3 claims
- 0564US4705911ASolar cell moduleMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1986·Granted Nov 10, 1987·19 cites·8 claims
- 0661US6545371B1Semiconductor device wherein detection of removal of wiring triggers impairing of normal operation of internal circuitSHARP KK·Filed 2001·Granted Apr 8, 2003·11 cites·20 claims
- 0759US6472730B1Semiconductor device and method of manufacturing the sameSHARP KK·Filed 2000·Granted Oct 29, 2002·10 cites·16 claims
- 0857US2021191229A1Supercontinuum source, method for generating and emitting a supercontinuum, multiphoton excitation fluorescence microscope, and multiphoton excitation methodUSHIO ELECTRIC INC·Filed 2021·Application pending·0 cites
- 0955US11079656B2Supercontinuum source, method for generating and emitting a supercontinuum, multiphoton excitation fluorescence microscope, and multiphoton excitation methodUSHIO ELECTRIC INC·Filed 2017·Granted Aug 3, 2021·0 cites·16 claims
- 1054US4607732ADrive mechanism for a mechanical pressKOMATSU MFG CO LTD·Filed 1983·Granted Aug 26, 1986·10 cites·1 claims
- 1152US9921398B2Drive control method for objective lens and fluorescence microscope systemRIKEN·Filed 2014·Granted Mar 20, 2018·0 cites·4 claims
- 1242US5336895AImpurity free reference grid for use charged partiole beam spectroscopesSHARP KK·Filed 1992·Granted Aug 9, 1994·6 cites·5 claims
- 1335US10866400B2Data recovery device, microscope system, and data recovery methodRIKEN·Filed 2017·Granted Dec 15, 2020·0 cites·16 claims
- 1433US6759722B2Semiconductor device and method of manufacturing the sameSHARP KK·Filed 2001·Granted Jul 6, 2004·0 cites·21 claims
- 1529US5301002AApparatus for inspecting a semiconductor deviceSHARP KK·Filed 1992·Granted Apr 5, 1994·3 cites·18 claims
- 1627US6005248AMethod for observing a reaction process by transmission electron microscopySHARP KK·Filed 1998·Granted Dec 21, 1999·4 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →