Inventor · disambiguated record
Akira Nishina
Also filed as: NISHINA AKIRA
9 granted patents·4 pending applications·92 citations·filing 1997–2022
88Inventor score
Top patents by PatentIndex Score
13 records- 0175US6523567B2Apparatus and process for supplying gasNIPPON OXYGEN CO LTD·Filed 2002·Granted Feb 25, 2003·20 cites·1 claims
- 0272US6474136B1Method and apparatus for analyzing impurities in gasesNIPPON OXYGEN CO LTD·Filed 2000·Granted Nov 5, 2002·10 cites·2 claims
- 0372US6397660B1Gas analyzing apparatusNIPPON OXYGEN CO LTD·Filed 2001·Granted Jun 4, 2002·9 cites·3 claims
- 0467US6478040B1Gas supplying apparatus and gas substitution methodNIPPON OXYGEN CO LTD·Filed 2000·Granted Nov 12, 2002·9 cites·5 claims
- 0563US6550308B2Gas analyzing apparatusNIPPON OXYGEN CO LTD·Filed 2002·Granted Apr 22, 2003·4 cites·1 claims
- 0657US6418781B1System for analyzing trace amounts of impurities in gasesNIPPON OXYGEN CO LTD·Filed 1999·Granted Jul 16, 2002·13 cites·3 claims
- 0755US6653144B1Method and an apparatus for analyzing trace impurities in gasesNIPPON OXYGEN CO LTD·Filed 2000·Granted Nov 25, 2003·2 cites·2 claims
- 0855US6324892B1Multi-gas analysis system for analyzing high-purity gasesNIPPON OXYGEN CO LTD·Filed 1999·Granted Dec 4, 2001·17 cites·11 claims
- 0951US2025276006A1Anticoronaviral agentNIPPON CATALYTIC CHEM IND·Filed 2022·Application pending·0 cites
- 1043US2003092193A1Method and an apparatus for analyzing trace impurities in gasesNIPPON OXYGEN CO LTD·Filed 2002·Application pending·0 cites
- 1143US2003086826A1Method and an apparatus for analyzing trace impurities in gasesNIPPON OXYGEN CO LTD·Filed 2002·Application pending·0 cites
- 1242US6000275AMethod for analyzing impurities in gas and its analyzerNIPPON OXYGEN CO LTD·Filed 1997·Granted Dec 14, 1999·8 cites·13 claims
- 1341US2002111747A1System and process for analysisFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →