Inventor · disambiguated record
Akihiko Ohi
Also filed as: OHI AKIHIKO
10 granted patents·144 citations·filing 1990–2016
88Inventor score
Files withFUJI ELECTRIC CO LTD4RIKEN KK2AGENCY IND SCIENCE TECHN1FUJI ELECTRIC HOLDINGS1OHI AKIHIKO1
Top patents by PatentIndex Score
10 records- 0191US9818845B2MOS-driven semiconductor device and method for manufacturing MOS-driven semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Nov 14, 2017·8 cites·9 claims
- 0287US5141714AExhaust gas cleanerRIKEN KK·Filed 1990·Granted Aug 25, 1992·78 cites·11 claims
- 0370US7510975B2Method for manufacturing a semiconductor device having trenches defined in the substrate surfaceFUJI ELECTRIC HOLDINGS·Filed 2005·Granted Mar 31, 2009·6 cites·14 claims
- 0470US5154901AMethod of cleaning an exhaust gas containing nitrogen oxides and fine carbon-containing particulatesRIKEN KK·Filed 1991·Granted Oct 13, 1992·31 cites·2 claims
- 0564US8399340B2Method of manufacturing super-junction semiconductor deviceOHI AKIHIKO·Filed 2011·Granted Mar 19, 2013·4 cites·5 claims
- 0658US9222970B2Fault position analysis method and fault position analysis device for semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2012·Granted Dec 29, 2015·1 cites·16 claims
- 0740US5422336ASuperconducting FET with Pr-Ba-Cu-O channelFUJI ELECTRIC CO LTD·Filed 1993·Granted Jun 6, 1995·7 cites·4 claims
- 0838US9553185B2MOS-driven semiconductor device and method for manufacturing MOS-driven semiconductor deviceSIN KIN-ON·Filed 2010·Granted Jan 24, 2017·0 cites·3 claims
- 0938US5441926ASuperconducting device structure with Pr-Ba-Cu-O barrier layerFUJI ELECTRIC CO LTD·Filed 1993·Granted Aug 15, 1995·4 cites·8 claims
- 1034US5275792AMethod of removing NOx from NOx -containing gasAGENCY IND SCIENCE TECHN·Filed 1992·Granted Jan 4, 1994·5 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →