Inventor · disambiguated record
Akinori Okubo
Also filed as: OKUBO AKINORI
14 granted patents·2 pending applications·6 citations·filing 2014–2024
83Inventor score
Top patents by PatentIndex Score
16 records- 0182US10476495B2Drive deviceNISSAN MOTOR·Filed 2016·Granted Nov 12, 2019·5 cites·9 claims
- 0275US10816480B2Method of detecting a defect on a substrate, apparatus for performing the same and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 27, 2020·1 cites·19 claims
- 0362US12313393B2Level sensor and substrate processing apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted May 27, 2025·0 cites·20 claims
- 0456US11916469B2Resonant power conversion deviceNISSAN MOTOR·Filed 2020·Granted Feb 27, 2024·0 cites·9 claims
- 0554US2025264324A1Semiconductor measurement system having monochromator and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0653US11946809B2Polarization measuring device and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Apr 2, 2024·0 cites·19 claims
- 0751US2023102791A1Apparatus for substrate dicing and method therofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 0848US11146163B2Switching device and method for controlling switching deviceNISSAN MOTOR·Filed 2018·Granted Oct 12, 2021·0 cites·13 claims
- 0945US10490622B2Semiconductor capacitorNISSAN MOTOR·Filed 2016·Granted Nov 26, 2019·0 cites·15 claims
- 1044US10658940B2Power converterNISSAN MOTOR·Filed 2014·Granted May 19, 2020·0 cites·9 claims
- 1143US10312897B2Switching deviceNISSAN MOTOR·Filed 2014·Granted Jun 4, 2019·0 cites·8 claims
- 1242US9880270B2Test device and imaging device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jan 30, 2018·0 cites·13 claims
- 1339US12172389B2Molding apparatus, manufacturing method, and fiber reinforced resin materialADEKA CORP·Filed 2016·Granted Dec 24, 2024·0 cites·17 claims
- 1438US10401301B2Optical test system and method, and method of manufacturing semiconductor device by using the optical test system and methodSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 3, 2019·0 cites·20 claims
- 1536US11312091B2Molding apparatus and manufacturing methodGH CRAFT LTD·Filed 2016·Granted Apr 26, 2022·0 cites·16 claims
- 1633US12126329B2Driving circuitNISSAN MOTOR·Filed 2021·Granted Oct 22, 2024·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →