Inventor · disambiguated record
Akio Oosaki
Also filed as: OOSAKI AKIO
3 granted patents·89 citations·filing 2000–2001
72Inventor score
Files withHITACHI ELECTR ENG3
Top patents by PatentIndex Score
3 records- 0191US6275023B1Semiconductor device tester and method for testing semiconductor deviceHITACHI ELECTR ENG·Filed 2000·Granted Aug 14, 2001·74 cites·16 claims
- 0262US6448800B1Load current output circuit for electronic device and IC tester using the same load current output circuitHITACHI ELECTR ENG·Filed 2000·Granted Sep 10, 2002·11 cites·13 claims
- 0349US6424201B2Diode element circuit and switch circuit using the sameHITACHI ELECTR ENG·Filed 2001·Granted Jul 23, 2002·4 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →