Inventor · disambiguated record
Akane Seki
Also filed as: SEKI AKANE
1 granted patent·1 pending application·0 citations·filing 2019–2019
10Inventor score
Files withSYSMEX CORP2
Top patents by PatentIndex Score
2 records- 0146US11619640B2Method for generating an index for quality control, apparatus for generating a quality control index, quality control data generation system, and method for constructing a quality control data generation systemSYSMEX CORP·Filed 2019·Granted Apr 4, 2023·0 cites·16 claims
- 0239US2019302136A1Apparatus for generating monitoring data of sample analyzer, sample analyzing apparatus, monitoring data generation system of sample analyzer, method of generating monitoring data of sample analyzer, and monitoring method of sample analyzerSYSMEX CORP·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →