Inventor · disambiguated record
Akira Sugawara
Also filed as: SUGAWARA AKIRA
102 granted patents·10 pending applications·2,345 citations·filing 1988–2024
99Inventor score
Files withSEMICONDUCTOR ENERGY LAB26DOWA METALTECH CO LTD20DOWA MINING CO18SANYO ELECTRIC CO11HITACHI LTD8
Top patents by PatentIndex Score
112 records- 0198US7569856B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted Aug 4, 2009·56 cites·23 claims
- 0298US7381599B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted Jun 3, 2008·69 cites·39 claims
- 0397US6049092ASemiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 1997·Granted Apr 11, 2000·194 cites·27 claims
- 0496US7525158B2Semiconductor device having pixel electrode and peripheral circuitSEMICONDUCTOR ENERGY LAB·Filed 2004·Granted Apr 28, 2009·69 cites·22 claims
- 0595US6867431B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 1994·Granted Mar 15, 2005·150 cites·28 claims
- 0695USD501580SEyelash curlerKAI R&D CENTER CO LTD·Filed 2003·Granted Feb 1, 2005·61 cites·1 claims
- 0794US6149988AMethod and system of laser processingSEMICONDUCTOR ENERGY LAB·Filed 1998·Granted Nov 21, 2000·107 cites·44 claims
- 0894US5708252AExcimer laser scanning systemSEMICONDUCTOR ENERGY LAB·Filed 1996·Granted Jan 13, 1998·167 cites·12 claims
- 0993US6261856B1Method and system of laser processingSEMICONDUCTOR ENERGY LAB·Filed 1998·Granted Jul 17, 2001·146 cites·40 claims
- 1092US8198683B2Semiconductor device including transistors with silicided impurity regionsKONUMA TOSHIMITSU·Filed 2010·Granted Jun 12, 2012·8 cites·24 claims
- 1191US9412482B2Cu-Ni-Co-Si based copper alloy sheet material and method for producing the sameDOWA METALTECH CO LTD·Filed 2013·Granted Aug 9, 2016·8 cites·2 claims
- 1289US6312762B1Process for production of copper or copper base alloysDOWA MINING CO·Filed 2000·Granted Nov 6, 2001·26 cites·14 claims
- 1388US6699337B2Copper-base alloys having improved punching properties on press and a process for producing themDOWA MINING CO·Filed 2001·Granted Mar 2, 2004·22 cites·17 claims
- 1487US7520733B2Multistage compression type rotary compressorSANYO ELECTRIC CO·Filed 2005·Granted Apr 21, 2009·7 cites·5 claims
- 1587US5849424AHard coated copper alloys, process for production thereof and connector terminals made therefromDOWA MINING CO·Filed 1996·Granted Dec 15, 1998·57 cites·25 claims
- 1687US5619045AThin film transistorSEMICONDUCTOR ENERGY LAB·Filed 1996·Granted Apr 8, 1997·87 cites·10 claims
- 1786US7847355B2Semiconductor device including transistors with silicided impurity regionsSEMICONDUCTOR ENERGY LAB·Filed 2009·Granted Dec 7, 2010·6 cites·27 claims
- 1886USD541987SSafety razorKAI R&D CENTER CO LTD·Filed 2006·Granted May 1, 2007·34 cites·1 claims
- 1986US6040067AHard coated copper alloysDOWA MINING CO·Filed 1997·Granted Mar 21, 2000·46 cites·6 claims
- 2086US5747355AMethod for producing a transistor using anodic oxidationSEMICONDUCTOR ENERGY LAB·Filed 1995·Granted May 5, 1998·82 cites·20 claims
- 2185US5576231AProcess for fabricating an insulated gate field effect transistor with an anodic oxidized gate electrodeSEMICONDUCTOR ENERGY LAB·Filed 1995·Granted Nov 19, 1996·75 cites·9 claims
- 2284US8193494B2Transmission electron microscope and method for observing specimen image with the sameHARADA KEN·Filed 2010·Granted Jun 5, 2012·7 cites·20 claims
- 2384US6891270B2Semiconductor device and method of manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted May 10, 2005·29 cites·78 claims
- 2484US5322575AProcess for production of copper base alloys and terminals using the sameDOWA MINING CO·Filed 1993·Granted Jun 21, 1994·35 cites·12 claims
- 2583US6627011B2Process for producing connector copper alloysDOWA MINING CO·Filed 2001·Granted Sep 30, 2003·21 cites·13 claims
- 2682US7798787B2Internal intermediate pressure multistage compression type rotary compressor, manufacturing method thereof and displacement ratio setting methodSANYO ELECTRIC CO·Filed 2006·Granted Sep 21, 2010·5 cites·2 claims
- 2782US7600986B2Filtering device for multistage compression type rotary compressorSANYO ELECTRIC CO·Filed 2005·Granted Oct 13, 2009·5 cites·5 claims
- 2882US6801391B2Magnetic head with ferrite between nonmagnetic portions and a nonmagnetic gapSONY CORP·Filed 2002·Granted Oct 5, 2004·16 cites·9 claims
- 2982US5672900AInsulated gate field effect transistor with an anodic oxidized gate electrodeFiled 1996·Granted Sep 30, 1997·61 cites·10 claims
- 3081US7131821B2Internal intermediate pressure multistage compression type rotary compressor, manufacturing method thereof and displacement ratio setting methodSANYO ELECTRIC CO·Filed 2003·Granted Nov 7, 2006·14 cites·2 claims
- 3179US5838508AColor filter and process for fabricating the same and electro-optical deviceSEMICONDUCTOR ENERGY LAB·Filed 1996·Granted Nov 17, 1998·49 cites·20 claims
- 3278US8097102B2Cu-Ti-based copper alloy sheet material and method of manufacturing sameGAO WEILIN·Filed 2008·Granted Jan 17, 2012·3 cites·9 claims
- 3378US7926185B2Scissors with combKAI R&D CENTER CO LTD·Filed 2008·Granted Apr 19, 2011·5 cites·8 claims
- 3477US5976988AEtching material and etching methodSEMICONDUCTOR ENERGY LAB·Filed 1996·Granted Nov 2, 1999·48 cites·12 claims
- 3575US5595638AMethod for manufacturing a semiconductor device utilizing an anodic oxidationSEMICONDUCTOR ENERGY LAB·Filed 1995·Granted Jan 21, 1997·40 cites·10 claims
- 3674US7351372B2Copper base alloy and method for producing sameDOWA MINING CO·Filed 2003·Granted Apr 1, 2008·10 cites·6 claims
- 3774US7293428B2Refrigerating machineSANYO ELECTRIC CO·Filed 2005·Granted Nov 13, 2007·5 cites·3 claims
- 3874US5541747AElectro-optical device utilizing a liquid crystal having a spontaneous polarizationSEMICONDUCTOR ENERGY LAB·Filed 1993·Granted Jul 30, 1996·41 cites·10 claims
- 3974US4877481APatterning method by laser scribingSEMICONDUCTOR ENERGY LAB·Filed 1988·Granted Oct 31, 1989·40 cites·12 claims
- 4073US6949150B2Connector copper alloys and a process for producing the sameDOWA MINING CO·Filed 2002·Granted Sep 27, 2005·10 cites·15 claims
- 4172US9318818B2Electrical connector and manufacturing method thereofYAZAKI CORP·Filed 2014·Granted Apr 19, 2016·7 cites·14 claims
- 4272US6254702B1Copper base alloys and terminals using the sameDOWA MINING CO·Filed 1999·Granted Jul 3, 2001·21 cites·40 claims
- 4371US6336979B1Wear resistant copper base alloy, method of preparing the same and electrical part using the sameDOWA MINING CO·Filed 2000·Granted Jan 8, 2002·27 cites·14 claims
- 4470US8871041B2Copper alloy plate and method for producing sameGAO WEILIN·Filed 2009·Granted Oct 28, 2014·1 cites·8 claims
- 4568US10062546B2Sample holder and focused-ion-beam machining device provided therewithHITACHI LTD·Filed 2013·Granted Aug 28, 2018·2 cites·13 claims
- 4668US6132529ALeadframe made of a high-strength, high-electroconductivity copper alloyDOWA MINING CO·Filed 1997·Granted Oct 17, 2000·33 cites·19 claims
- 4768US5580800AMethod of patterning aluminum containing group IIIb ElementSEMICONDUCTOR ENERGY LAB·Filed 1994·Granted Dec 3, 1996·40 cites·11 claims
- 4867US9032118B2Administration device, information processing device, and data transfer methodFUJITSU LTD·Filed 2013·Granted May 12, 2015·2 cites·7 claims
- 4966US10072348B2Silver-plated productDOWA METALTECH CO LTD·Filed 2014·Granted Sep 11, 2018·0 cites·3 claims
- 5066US9875878B2Sample holder and analytical vacuum deviceHITACHI LTD·Filed 2013·Granted Jan 23, 2018·1 cites·9 claims
Showing the top 50 of 112 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →