Inventor · disambiguated record
Akihiko Yoshikawa
Also filed as: YOSHIKAWA AKIHIKO
11 granted patents·1 pending application·59 citations·filing 2003–2011
86Inventor score
Top patents by PatentIndex Score
12 records- 0190US7825360B2Optical apparatus provided with correction collar for aberration correction and imaging method using sameOLYMPUS CORP·Filed 2008·Granted Nov 2, 2010·26 cites·17 claims
- 0287US7986824B2Predetermined site luminescence measuring method, predetermined site luminescence measuring apparatus, expression amount measuring method, and measuring apparatusOLYMPUS CORP·Filed 2006·Granted Jul 26, 2011·14 cites·37 claims
- 0380US8280142B2Predetermined site luminescence measuring method, predetermined site luminescence measuring apparatus, expression amount measuring method, and measuring apparatusSUZUKI HIROBUMI·Filed 2011·Granted Oct 2, 2012·6 cites·8 claims
- 0467US9444000B2Photoelectric conversion deviceYOSHIKAWA AKIHIKO·Filed 2011·Granted Sep 13, 2016·2 cites·6 claims
- 0567US7945108B2Microscope apparatus control method and microscope apparatusOLYMPUS CORP·Filed 2007·Granted May 17, 2011·4 cites·22 claims
- 0659US6856005B2Semiconductor device having a nitride-based hetero-structure and method of manufacturing the sameUNIV CHIBA·Filed 2003·Granted Feb 15, 2005·7 cites·2 claims
- 0748US8699129B2Microscope system, storage medium storing control program, and control methodSHIROTA TETSUYA·Filed 2011·Granted Apr 15, 2014·0 cites·9 claims
- 0848US8194313B2Microscope and lamphouseYOSHIKAWA AKIHIKO·Filed 2011·Granted Jun 5, 2012·0 cites·8 claims
- 0945US2007091939A1Microscope and lamphouseYOSHIKAWA AKIHIKO·Filed 2006·Application pending·0 cites
- 1039US8268075B2Method of producing zinc oxide semiconductor crystalOMICHI KOJI·Filed 2007·Granted Sep 18, 2012·0 cites·5 claims
- 1133US9509124B2Photoelectric conversion device and characteristic inspection method for sameYOSHIKAWA AKIHIKO·Filed 2011·Granted Nov 29, 2016·0 cites·9 claims
- 1228US9530920B2Photoelectric conversion deviceYOSHIKAWA AKIHIKO·Filed 2010·Granted Dec 27, 2016·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →