Inventor · disambiguated record
Albert Archwamety
Also filed as: ARCHWAMETY ALBERT
3 granted patents·10 citations·filing 2010–2019
58Inventor score
Top patents by PatentIndex Score
3 records- 0179US8885918B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Nov 11, 2014·9 cites·22 claims
- 0249US10151580B2Methods of inspecting a 3D object using 2D image processingGeneric Power Ptd Ltd·Filed 2015·Granted Dec 11, 2018·1 cites·7 claims
- 0338US11825211B2Method of color inspection by using monochrome imaging with multiple wavelengths of lightMIT SEMICONDUCTOR PTE LTD·Filed 2019·Granted Nov 21, 2023·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →