Inventor · disambiguated record
Alan Bruce Berezin
Also filed as: BEREZIN ALAN · BEREZIN ALAN B · BEREZIN ALAN BRUCE
7 granted patents·467 citations·filing 1995–2020
88Inventor score
Top patents by PatentIndex Score
7 records- 0191US5777901AMethod and system for automated die yield prediction in semiconductor manufacturingADVANCED MICRO DEVICES INC·Filed 1995·Granted Jul 7, 1998·162 cites·27 claims
- 0288US5539752AMethod and system for automated analysis of semiconductor defect dataADVANCED MICRO DEVICES INC·Filed 1995·Granted Jul 23, 1996·112 cites·38 claims
- 0386US5831865AMethod and system for declusturing semiconductor defect dataADVANCED MICRO DEVICES INC·Filed 1997·Granted Nov 3, 1998·77 cites·37 claims
- 0484US5649169AMethod and system for declustering semiconductor defect dataADVANCED MICRO DEVICES INC·Filed 1995·Granted Jul 15, 1997·70 cites·33 claims
- 0572US6268717B1Semiconductor test structure with intentional partial defects and method of useADVANCED MICRO DEVICES INC·Filed 1999·Granted Jul 31, 2001·43 cites·20 claims
- 0659US10577895B2Energy deposit discovery system and methodBEREZIN ALAN BRUCE·Filed 2012·Granted Mar 3, 2020·3 cites·24 claims
- 0753US11268353B2Energy deposit discovery system and methodENVERUS INC·Filed 2020·Granted Mar 8, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →