Inventor · disambiguated record
Alexander Sebastian Biewenga
Also filed as: BIEWENGA ALEXANDER · BIEWENGA ALEXANDER S · BIEWENGA ALEXANDER SEBASTIAN
4 granted patents·2 pending applications·6 citations·filing 2002–2011
65Inventor score
Files withNXP BV2DE JONG FRANSCISCUS G M1JONG FRANSCISCUS GERADUS MARIE DE1KONINKL PHILIPS ELECTRONICS NV1
Top patents by PatentIndex Score
6 records- 0148US7948243B2Testable integrated circuit, system in package and test instruction setNXP BV·Filed 2006·Granted May 24, 2011·2 cites·16 claims
- 0238US8829940B2Method for testing a partially assembled multi-die device, integrated circuit die and multi-die deviceJONG FRANSCISCUS GERADUS MARIE DE·Filed 2009·Granted Sep 9, 2014·2 cites·15 claims
- 0336US6883129B2Electronic circuit and method for testingKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Apr 19, 2005·2 cites·11 claims
- 0435US8653847B2Testable integrated circuit, system in package and test instruction setDE JONG FRANSCISCUS G M·Filed 2011·Granted Feb 18, 2014·0 cites·3 claims
- 0533US2011018550A1Integrated circuit with test arrangement, integrated circuit arrangement and text methodNXP BV·Filed 2009·Application pending·0 cites
- 0630US2004177300A1Apparatus with a test interfaceFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →