Inventor · disambiguated record
Albert Bukys
Also filed as: BUKYS ALBERT · BUKYS ALBERT K
8 granted patents·4 pending applications·180 citations·filing 2003–2012
88Inventor score
Files withAFFYMETRIX INC6HONKANEN PETER2WEINER NATHAN K2AFFYMETRIX INC A CORP ORGANIZE1AUSHON BIOSYSTEMS1
Top patents by PatentIndex Score
12 records- 0196US7689022B2System, method, and product for scanning of biological materialsAFFYMETRIX INC·Filed 2003·Granted Mar 30, 2010·134 cites·21 claims
- 0292US8391582B2System and method for scanning of probe arraysWEINER NATHAN K·Filed 2012·Granted Mar 5, 2013·16 cites·18 claims
- 0385US7983467B2System, method, and product for scanning of biological materialsAFFYMETRIX INC·Filed 2010·Granted Jul 19, 2011·4 cites·55 claims
- 0483US8246760B2Continual flow pin washerHONKANEN PETER·Filed 2011·Granted Aug 21, 2012·4 cites·15 claims
- 0580US8679262B2Continual flow pin washerHONKANEN PETER·Filed 2012·Granted Mar 25, 2014·3 cites·7 claims
- 0680US8208710B2System, method, and product for scanning of biological materialsWEINER NATHAN K·Filed 2011·Granted Jun 26, 2012·3 cites·20 claims
- 0780US7871812B2System, method, and product for scanning of biological materialsAFFYMETRIX INC·Filed 2004·Granted Jan 18, 2011·13 cites·28 claims
- 0871US8020571B2Continual flow pin washerAUSHON BIOSYSTEMS·Filed 2008·Granted Sep 20, 2011·3 cites·21 claims
- 0951US2006293860A1System, method, and computer product for correction of feature overlapAFFYMETRIX INC A CORP ORGANIZE·Filed 2006·Application pending·0 cites
- 1050US2006184038A1System, method, and product for analyzing images comprising small feature sizesAFFYMETRIX INC·Filed 2005·Application pending·0 cites
- 1147US2005030601A1System and method for scanner instrument calibration using a calibration standardAFFYMETRIX INC·Filed 2004·Application pending·0 cites
- 1234US2005238354A1System, method, and product for increased signal and reduced noise detectionAFFYMETRIX INC·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →