Inventor · disambiguated record
Alexander Giles Davies
Also filed as: DAVIES ALEXANDER · DAVIES ALEXANDER G · DAVIES ALEXANDER GILES
9 granted patents·4 pending applications·113 citations·filing 1999–2014
85Inventor score
Top patents by PatentIndex Score
13 records- 0186US6388799B1Optical device and imaging systemTOSHIBA RES EUROP LTD·Filed 1999·Granted May 14, 2002·85 cites·56 claims
- 0277US10180397B2Laser system for imaging and materials analysisUNIV QUEENSLAND·Filed 2014·Granted Jan 15, 2019·6 cites·25 claims
- 0374US8809092B2Generating and detecting radiationLINFIELD EDMUND·Filed 2010·Granted Aug 19, 2014·5 cites·39 claims
- 0462US7498593B2Terahertz radiation sources and methodsUNIV CAMBRIDGE TECH·Filed 2004·Granted Mar 3, 2009·13 cites·23 claims
- 0556US9494583B2Methods and devices for detecting structural changes in a molecule measuring electrochemical impedanceUNIV LEEDS INNOVATIONS LTD·Filed 2012·Granted Nov 15, 2016·0 cites·13 claims
- 0655US10350613B2Method and apparatus for manipulating particlesUNIV LEEDS INNOVATIONS LTD·Filed 2014·Granted Jul 16, 2019·1 cites·20 claims
- 0752US2010234234A1Methods and Devices for Detecting Structural Changes in a Molecule Measuring Electrochemical ImpedanceUNIV LEEDS·Filed 2007·Application pending·0 cites
- 0852US2011310379A1Apparatus and method for measuring terahertz-absorption characteristics of samplesBYRNE MATTHEW·Filed 2009·Application pending·0 cites
- 0951US7887691B2Arrays of electrodes coated with molecules and their productionUNIV CAMBRIDGE TECH·Filed 2003·Granted Feb 15, 2011·0 cites·25 claims
- 1046US7382806B2THz semiconductor laser incorporating a controlled plasmon confinement waveguideINFM·Filed 2003·Granted Jun 3, 2008·3 cites·13 claims
- 1140US2006049356A1Terahertz spectroscopySHEN YAOCHUN·Filed 2003·Application pending·0 cites
- 1236US9263264B2Oxide removal from semiconductor surfaces using a flux of indium atomsLI LIANHE·Filed 2012·Granted Feb 16, 2016·0 cites·25 claims
- 1327US2004100893A1Data storage mediumUNIV CAMBRIDGE TECH·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →