Inventor · disambiguated record
Alexandre De Chambrier
Also filed as: DE CHAMBRIER ALEXANDRE · DE CHAMBRIER ALEXANDRE D
10 granted patents·3 pending applications·85 citations·filing 1997–2023
85Inventor score
Top patents by PatentIndex Score
13 records- 0197US11670488B2Fast arc detecting match networkCOMET TECHNOLOGIES USA INC·Filed 2021·Granted Jun 6, 2023·7 cites·20 claims
- 0297US11605527B2Pulsing control match networkCOMET TECHNOLOGIES USA INC·Filed 2021·Granted Mar 14, 2023·7 cites·11 claims
- 0384US11830708B2Inductive broad-band sensors for electromagnetic wavesCOMET TECHNOLOGIES USA INC·Filed 2021·Granted Nov 28, 2023·1 cites·20 claims
- 0483US12027351B2Plasma non-uniformity detectionCOMET TECHNOLOGIES USA INC·Filed 2021·Granted Jul 2, 2024·1 cites·20 claims
- 0582US11961711B2Radio frequency match network and generatorCOMET TECHNOLOGIES USA INC·Filed 2021·Granted Apr 16, 2024·1 cites·21 claims
- 0678US12505984B2Pulsing control match network and generatorCOMET TECHNOLOGIES USA INC·Filed 2023·Granted Dec 23, 2025·0 cites·8 claims
- 0778US5986874AElectrostatic support assembly having an integral ion focus ringWATKINS JOHNSON CO·Filed 1997·Granted Nov 16, 1999·68 cites·29 claims
- 0875US12272532B2Inductive broad-band sensors for electromagnetic wavesCOMET TECHNOLOGIES USA INC·Filed 2023·Granted Apr 8, 2025·0 cites·18 claims
- 0975US2023260755A1Fast arc detecting match networkCOMET TECHNOLOGIES USA INC·Filed 2023·Application pending·0 cites
- 1062US11521832B2Uniformity control for radio frequency plasma processing systemsCOMET TECHNOLOGIES USA INC·Filed 2021·Granted Dec 6, 2022·0 cites·18 claims
- 1161US11887820B2Sector shunts for plasma-based wafer processing systemsCOMET TECHNOLOGIES USA INC·Filed 2021·Granted Jan 30, 2024·0 cites·20 claims
- 1247US2021217588A1Azimuthal sensor array for radio frequency plasma-based wafer processing systemsCOMET TECHNOLOGIES USA INC·Filed 2021·Application pending·0 cites
- 1336US2013206725A1Creation of off-axis null magnetic field locus for improved uniformity in plasma deposition and etchingLEESER KARL·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →