Inventor · disambiguated record
Alexander L. Flamholz
Also filed as: FLAMHOLZ ALEXANDER L
6 granted patents·121 citations·filing 1974–1992
85Inventor score
Files withIBM6
Top patents by PatentIndex Score
6 records- 0183US4172664AHigh precision pattern registration and overlay measurement system and processIBM·Filed 1977·Granted Oct 30, 1979·33 cites·13 claims
- 0277US5235626ASegmented mask and exposure system for x-ray lithographyIBM·Filed 1991·Granted Aug 10, 1993·32 cites·7 claims
- 0367US3957376AMeasuring method and system using a diffraction patternIBM·Filed 1974·Granted May 18, 1976·20 cites·32 claims
- 0451US5268951AX-ray beam scanning method for producing low distortion or constant distortion in x-ray proximity printingIBM·Filed 1992·Granted Dec 7, 1993·16 cites·3 claims
- 0547US4679938ADefect detection in films on ceramic substratesIBM·Filed 1985·Granted Jul 14, 1987·12 cites·20 claims
- 0646US4637714AInspection system for pellicalized reticlesIBM·Filed 1985·Granted Jan 20, 1987·8 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →