Inventor · disambiguated record
Alejandro S. Jaime
Also filed as: JAIME ALEJANDRO · JAIME ALEJANDRO S
3 granted patents·1 pending application·33 citations·filing 2004–2019
68Inventor score
Top patents by PatentIndex Score
4 records- 0186US10254214B1Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2018·Granted Apr 9, 2019·6 cites·12 claims
- 0279US7036985B2X-ray positioning deviceULTRADENT PRODUCTS INC·Filed 2004·Granted May 2, 2006·26 cites·13 claims
- 0370US11125677B2Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2019·Granted Sep 21, 2021·1 cites·12 claims
- 0441US2019242790A1Methods and Apparatuses for Cutting Specimens for Microscopic ExaminationNANOTRONICS IMAGING INC·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →