Inventor · disambiguated record
Alex Kalnitsky
Also filed as: KALNITSKY ALEX
27 granted patents·1 pending application·285 citations·filing 1993–2024
96Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD12KALNITSKY ALEX3ST MICROELECTRONICS INC3TAIWAN SEMICONDUCTOR MFG3SGS THOMSON MICROELECTRONICS2
Top patents by PatentIndex Score
28 records- 0196US9178080B2Deep trench structure for high density capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted Nov 3, 2015·49 cites·20 claims
- 0296US8716852B2Micro-electro mechanical systems (MEMS) having outgasing prevention structures and methods of forming the sameSHU CHIA-PAO·Filed 2012·Granted May 6, 2014·26 cites·20 claims
- 0393US8895360B2Integrated semiconductor device and wafer level method of fabricating the sameTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 25, 2014·12 cites·20 claims
- 0492US8389348B2Mechanism of forming SiC crystalline on Si substrates to allow integration of GaN and Si electronicsTHEI KONG-BENG·Filed 2010·Granted Mar 5, 2013·13 cites·19 claims
- 0591US10241535B2Flipped gate voltage reference having boxing region and method of usingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Mar 26, 2019·7 cites·20 claims
- 0690US5435888AEnhanced planarization technique for an integrated circuitSGS THOMSON MICROELECTRONICS·Filed 1993·Granted Jul 25, 1995·88 cites·21 claims
- 0789US9266714B2Micro-electro mechanical system (MEMS) structures and methods of forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 23, 2016·6 cites·20 claims
- 0889US9269591B2Handle wafer for high resistivity trap-rich SOITAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Feb 23, 2016·10 cites·16 claims
- 0987US8878312B2Electrical bypass structure for MEMS deviceHUNG CHIA-MING·Filed 2011·Granted Nov 4, 2014·16 cites·15 claims
- 1082US2024345612A1Flipped gate voltage reference circuit and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1180US9735266B2Self-aligned contact for trench MOSFETTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 15, 2017·4 cites·20 claims
- 1274US11068007B2Flipped gate voltage reference and method of usingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jul 20, 2021·1 cites·20 claims
- 1372US12038773B2Flipped gate voltage reference and method of usingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jul 16, 2024·0 cites·20 claims
- 1472US11269368B2Flipped gate voltage reference and method of usingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Mar 8, 2022·3 cites·20 claims
- 1571US9968927B2Optical biosensor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 15, 2018·2 cites·20 claims
- 1671USRE39690EEnhanced planarization technique for an integrated circuitST MICROELECTRONICS INC·Filed 2001·Granted Jun 12, 2007·9 cites·29 claims
- 1770US8633086B2Power devices having reduced on-resistance and methods of their manufactureKALNITSKY ALEX·Filed 2009·Granted Jan 21, 2014·3 cites·24 claims
- 1868US8497551B2Self-aligned contact for trench MOSFETKALNITSKY ALEX·Filed 2010·Granted Jul 30, 2013·2 cites·20 claims
- 1964US5837613AEnhanced planarization technique for an integrated circuitST MICROELECTRONICS INC·Filed 1997·Granted Nov 17, 1998·19 cites·21 claims
- 2062US9337182B2Method to integrate different function devices fabricated by different process technologiesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted May 10, 2016·1 cites·18 claims
- 2156US5986330AEnhanced planarization technique for an integrated circuitST MICROELECTRONICS INC·Filed 1998·Granted Nov 16, 1999·13 cites·22 claims
- 2254US10014291B2SiC crystalline on Si substrates to allow integration of GaN and Si electronicsTHEI KONG BENG·Filed 2013·Granted Jul 3, 2018·0 cites·20 claims
- 2354US9254487B2Systems and methods for an integrated bio-entity manipulation and processing semiconductor deviceTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 9, 2016·0 cites·20 claims
- 2453US10381259B2Semiconductor device with localized carrier lifetime reduction and fabrication method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Aug 13, 2019·0 cites·16 claims
- 2551US10068836B2Metal gate transistor, integrated circuits, systems, and fabrication methods thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Sep 4, 2018·0 cites·20 claims
- 2650US9698044B2Localized carrier lifetime reductionKALNITSKY ALEX·Filed 2011·Granted Jul 4, 2017·0 cites·20 claims
- 2745US9620421B2Metal gate transistor, integrated circuits, systems, and fabrication methods thereofHO CHIEN-CHIH·Filed 2010·Granted Apr 11, 2017·0 cites·21 claims
- 2832US5633534AIntegrated circuit with enhanced planarizationSGS THOMSON MICROELECTRONICS·Filed 1996·Granted May 27, 1997·1 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →