Inventor · disambiguated record
Aleksander Labuda
Also filed as: LABUDA ALEKSANDER
14 granted patents·1 pending application·31 citations·filing 2011–2024
89Inventor score
Files withOXFORD INSTRUMENTS ASYLUM RES INC8OXFORD INSTR ASYLUM RES INC3OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD1RASSIER DILSON1THE ROYAL INST FOR THE ADVANCEMENT OF LEARNING / MCGILL UNIV1
Top patents by PatentIndex Score
15 records- 0193US9841436B2AM/FM measurements using multiple frequency of atomic force microscopyOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2016·Granted Dec 12, 2017·5 cites·7 claims
- 0293US9453857B2AM/FM measurements using multiple frequency of atomic force microscopyOXFORD INSTR ASYLUM RES INC·Filed 2015·Granted Sep 27, 2016·6 cites·1 claims
- 0391US10444258B2AM/FM measurements using multiple frequency atomic force microscopyOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2017·Granted Oct 15, 2019·3 cites·3 claims
- 0491US10338096B2Metrological scanning probe microscopeOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2017·Granted Jul 2, 2019·3 cites·7 claims
- 0587US11644478B2Automated optimization of AFM light source positioningOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2022·Granted May 9, 2023·2 cites·12 claims
- 0687US9383386B2Optical beam positioning unit for atomic force microscopeOXFORD INSTR ASYLUM RES INC·Filed 2014·Granted Jul 5, 2016·7 cites·18 claims
- 0784US10705114B2Metrological scanning probe microscopeOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2019·Granted Jul 7, 2020·2 cites·14 claims
- 0876US10054612B2Optical beam positioning unit for atomic force microscopeOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2016·Granted Aug 21, 2018·1 cites·6 claims
- 0969USRE49997EMetrological scanning probe microscopeOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2021·Granted Jun 4, 2024·0 cites·31 claims
- 1066US12055560B2Automated optimization of AFM light source positioningOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2023·Granted Aug 6, 2024·0 cites·20 claims
- 1160US9075235B2Method and system for optical microscopyUNIV MCGILL·Filed 2012·Granted Jul 7, 2015·2 cites·9 claims
- 1258US9804193B2Metrological scanning probe microscopeOXFORD INSTR ASYLUM RES INC·Filed 2015·Granted Oct 31, 2017·0 cites·3 claims
- 1357US2025164523A1Methods for positioning a measurement spot using a scanning probe microscropeOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2024·Application pending·0 cites
- 1433US9671424B2Methods and systems for optimizing frequency modulation atomic force microscopyTHE ROYAL INST FOR THE ADVANCEMENT OF LEARNING/MCGILL UNIV·Filed 2013·Granted Jun 6, 2017·0 cites·6 claims
- 1531US8667611B2Method and apparatus for measuring cantilever deflection in constrained spacesRASSIER DILSON·Filed 2011·Granted Mar 4, 2014·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →