Inventor · disambiguated record
Alan Henry Leek
Also filed as: LEEK ALAN H · LEEK ALAN HENRY
10 granted patents·21 citations·filing 2012–2021
84Inventor score
Top patents by PatentIndex Score
10 records- 0183US9902068B1Impedance signature analyzer to control automated actionsTEXAS INSTRUMENTS INC·Filed 2016·Granted Feb 27, 2018·5 cites·20 claims
- 0282US9575014B2Material determination by sweeping a range of frequenciesTEXAS INSTRUMENTS INC·Filed 2014·Granted Feb 21, 2017·4 cites·2 claims
- 0378US9599739B2Material-discerning sensing by measurement of different points of impedanceTEXAS INSTRUMENTS INC·Filed 2014·Granted Mar 21, 2017·3 cites·18 claims
- 0476US9201548B2Material-discerning proximity sensingLEEK ALAN HENRY·Filed 2012·Granted Dec 1, 2015·6 cites·11 claims
- 0572US10925154B2Tamper detectionTEXAS INSTRUMENTS INC·Filed 2019·Granted Feb 16, 2021·1 cites·23 claims
- 0672US10474307B2Material-discerning proximity sensingTEXAS INSTRUMENTS INC·Filed 2015·Granted Nov 12, 2019·2 cites·20 claims
- 0764US11805596B2Tamper detectionTEXAS INSTRUMENTS INC·Filed 2021·Granted Oct 31, 2023·0 cites·23 claims
- 0859US10684235B2Material determination by sweeping a range of frequenciesTEXAS INSTRUMENTS INC·Filed 2017·Granted Jun 16, 2020·0 cites·12 claims
- 0946US10514348B2Impedance signature analyzer to control automated actionsTEXAS INSTRUMENTS INC·Filed 2018·Granted Dec 24, 2019·0 cites·11 claims
- 1044US10191097B2Square-wave-based impedance analysisTEXAS INSTRUMENTS INC·Filed 2016·Granted Jan 29, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →